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Integrated Ferroelectrics
An International Journal
Volume 14, 1997 - Issue 1-4
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Materials processing - PVD

Structural characterization of Ba0.5Sr0.5,TiO3 on RuO2 prepared by pulsed laser deposition

Q. X. Jia Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G755, Los Alamos, NM, 87545, USA
,
A. T. Findikoglu Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G755, Los Alamos, NM, 87545, USA
,
R. Zhou Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G755, Los Alamos, NM, 87545, USA
,
S. R. Foltyn Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G755, Los Alamos, NM, 87545, USA
&
X. D. Wu Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G755, Los Alamos, NM, 87545, USA
Pages 167-172 | Received 18 Mar 1996, Published online: 19 Aug 2006

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Q.X. Jia, J.M. Roper, P.N. Arendt, S.R. Foltyn, Y. Fan & J.R. Groves. (1998) Oriented conductive oxide electrodes on SiO2/Si. Integrated Ferroelectrics 21:1-4, pages 397-406.
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Articles from other publishers (1)

J. F. Scott. (1998) HIGH-DIELECTRIC CONSTANT THIN FILMS FOR DYNAMIC RANDOM ACCESS MEMORIES (DRAM). Annual Review of Materials Science 28:1, pages 79-100.
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