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Integrated Ferroelectrics
An International Journal
Volume 22, 1998 - Issue 1-4
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Session 10. Piezoelectric and mems applications

Electromechanical properties of PMN-PT thin films prepared by pulsed laser deposition technique

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Pages 515-523 | Received 26 Mar 1998, Published online: 19 Aug 2006

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Read on this site (4)

M. Levy, S. Ghimire, A. K. Bandyopadhyay, Y. K. Hong, K. Moon, S. Bakhru & H. Bakhru. (2002) PZN-PT Single-Crystal Thin Film Monomorph Actuator. Ferroelectrics Letters Section 29:3-4, pages 29-40.
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H.Y. Cheung, F.F. Hau, Jie Wang & K.H. Wong. (2001) Heteroepitaxial growth of Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films for integrated devices. Ferroelectrics 260:1, pages 219-224.
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Andrei Kholkin. (2001) Electromechanical properties of ferroelectric films for MEMS. Ferroelectrics 258:1, pages 209-220.
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Zian Kighelman, Dragan Damjanovic, Andreas Seifert, Stephane Hiboux, Laurent Sagalowicz & Nava Setter. (1999) Relaxor Pb(Mg1/3Nb2/3)O3 thin films and their electromechanical properties. Integrated Ferroelectrics 25:1-4, pages 125-133.
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Articles from other publishers (14)

Nicholas A. Strnad, Daniel M. Potrepka, Brendan M. Hanrahan, Glen R. Fox, Ronald G. Polcawich, Jeffrey S. Pulskamp, Ryan R. Knight & Ryan Q. Rudy. (2023) Extending atomic layer deposition for use in next-generation piezoMEMS: Review and perspective. Journal of Vacuum Science & Technology A 41:5.
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Jieun Kim, Derek J. Meyers, Abinash Kumar, Abel Fernandez, Gabriel A.P. Velarde, Zishen Tian, Jong-Woo Kim, James M. LeBeau, Philip J. Ryan & Lane W. Martin. (2021) Frequency-dependent suppression of field-induced polarization rotation in relaxor ferroelectric thin films. Matter 4:7, pages 2367-2377.
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Pius Augustine, Martando Rath, G.R. Haripriya, K. Sethupahi & M. S. Ramachandra Rao. (2020) Realization of 1 μm thick, crack-free and smooth PMN-PT film in the MPB through PLD: A comprehensive study. Ceramics International 46:17, pages 26767-26776.
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Ellen Wachtel, Anatoly I. Frenkel & Igor Lubomirsky. (2018) Anelastic and Electromechanical Properties of Doped and Reduced Ceria. Advanced Materials 30:41, pages 1707455.
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Dongjoon Kim, Byung-Han Ko, Sanggeuk Jeong, No-Cheol Park & Young-Pil Park. (2015) Vibration reduction of MLCC considering piezoelectric and electrostriction effect. Vibration reduction of MLCC considering piezoelectric and electrostriction effect.
P. D. Moran & M. Levy. (2003) Thermal exfoliation and crystallographic transformation of single-crystal metal oxides induced by He-ion implantation. Journal of Applied Physics 94:5, pages 3045-3050.
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Qifa Zhou, Qingqi Zhang, Baomin Xu & Susan Trolier‐McKinstry. (2004) In‐Plane Polarized 0.7Pb(Mg 1/3 Nb 2/3 )O 3 –0.3PbTiO 3 Thin Films . Journal of the American Ceramic Society 85:8, pages 1997-2000.
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V. V. Shvartsman, A. Yu. Emelyanov, A. L. Kholkin & A. Safari. (2002) Local hysteresis and grain size effect in Pb(Mg1/3Nb2/3)O3–PbTiO3 thin films. Applied Physics Letters 81:1, pages 117-119.
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Naoki Wakiya, Kazuo Shinozaki & Nobuyasu Mizutani. (2002) Stabilization of perovskite Pb(Mg1/3Nb2/3)O3 thin film by a thin BaTiO3 buffer layer on Pt/Ti/SiO2/Si. Thin Solid Films 409:2, pages 248-253.
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A. L. Kholkin, V. V. Shvartsman, M. Woitas & A. Safari. (2011) Local Electromechanical Properties and Grain Size Effects in Ferroelectric Relaxors Studied by Scanning Piezoelectric Microscopy. MRS Proceedings 748.
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Zian Kighelman, Dragan Damjanovic & Nava Setter. (2001) Dielectric and electromechanical properties of ferroelectric-relaxor 0.9 Pb(Mg1/3Nb2/3)O3–0.1PbTiO3 thin films. Journal of Applied Physics 90:9, pages 4682-4689.
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A. L. Kholkin, E. K. Akdogan, A. Safari, P.-F. Chauvy & N. Setter. (2001) Characterization of the effective electrostriction coefficients in ferroelectric thin films. Journal of Applied Physics 89:12, pages 8066-8073.
Crossref
Zian Kighelman, Dragan Damjanovic & Nava Setter. (2001) Electromechanical properties and self-polarization in relaxor Pb(Mg1/3Nb2/3)O3 thin films. Journal of Applied Physics 89:2, pages 1393-1401.
Crossref
A. L. Kholkin, K. G. Brooks, D. V. Taylor, N. Setter & A. Safari. (2011) Electromechanical Properties of Lead-Based Ferroelectric Thin Films. MRS Proceedings 541.
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