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Original Articles

ON-LINE FIBRE OPTIC BASED INSPECTION USING CHROMATIC MODULATION FOR SEMICONDUCTOR MATERIALS PROCESSING

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Pages 379-389 | Published online: 26 Apr 2007

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R.J. YU, P.J.G. LISBOA, P.C. RUSSELL & G.R. JONES. (1997) RESOLUTION CAPABILITIES OF CHROMATIC SENSING IN THE MONITORING OF SEMICONDUCTOR PLASMA PROCESSING SYSTEMS. Nondestructive Testing and Evaluation 13:6, pages 347-360.
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Articles from other publishers (5)

B Djakov, G Jones & Y Yokomizu. 2008. Chromatic Monitoring of Complex Conditions. Chromatic Monitoring of Complex Conditions.
P.C. Russell, B.E. Djakov, R. Enikov, D.H. Oliver, Y. Wen & G.R. Jones. (2003) Monitoring plasma jets containing micro particles with chromatic techniques. Sensor Review 23:1, pages 60-65.
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P.C. Russell & G.R. Jones. (2000) Chromatic monitoring of plasma and plasma systems. Vacuum 58:2-3, pages 88-99.
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K.J. Brazier, P.C. Russell, G.R. Jones & I. Shankland. (2000) A statistical approach to economical camera‐based colorimetric comparison. Sensor Review 20:1, pages 43-49.
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G. R. Jones, R. E. Jones & R. Jones. 2000. Optical Fiber Sensor Technology. Optical Fiber Sensor Technology 1 77 .

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