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Philosophical Magazine B Volume 81, 2001 - Issue 11
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Original Articles

Sub-ångström resolution of atomistic structures below 0.8 Å

M. A. O'keefe National Center for Electron Microscopy, Lawrence Berkeley National Laboratory B72, Berkeley, California, 94720, USA
,
E. C. Nelson National Center for Electron Microscopy, Lawrence Berkeley National Laboratory B72, Berkeley, California, 94720, USA
,
Y. C. Wang National Center for Electron Microscopy, Lawrence Berkeley National Laboratory B72, Berkeley, California, 94720, USA; Institut für Festkörperforschung Forschungszentrum Jülich GmbH, D-52425, Jülich, Germany
&
A. Thust FEI Co., Hillsboro, Oregon, 97124, USA
Pages 1861-1878 | Published online: 25 Aug 2009

Citations (29)

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K. Tillmann, L. Houben & A. Thust. (2006) Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval. Philosophical Magazine 86:29-31, pages 4589-4606.
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Articles from other publishers (28)

Colum M. O’Leary, Gerardo T. Martinez, Emanuela Liberti, Martin J. Humphry, Angus I. Kirkland & Peter D. Nellist. (2021) Contrast transfer and noise considerations in focused-probe electron ptychography. Ultramicroscopy 221, pages 113189.
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T. Tanigaki, T. Akashi, Y. Takahashi, T. Kawasaki & H. Shinada. 2016. 69 125 .
Yan Xin, John Kynoch, Ke Han, Zhiyong Liang, Peter J. Lee, David C. Larbalestier, Yi-Feng Su, Kohei Nagahata, Toshihiro Aoki & Paolo Longo. (2013) Facility Implementation and Comparative Performance Evaluation of Probe-Corrected TEM/STEM with Schottky and Cold Field Emission Illumination. Microscopy and Microanalysis 19:2, pages 487-495.
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Larissa F. Dobrzhinetskaya. (2012) Microdiamonds — Frontier of ultrahigh-pressure metamorphism: A review. Gondwana Research 21:1, pages 207-223.
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Sarah J. Haigh & Angus I. Kirkland. 2012. Modeling Nanoscale Imaging in Electron Microscopy. Modeling Nanoscale Imaging in Electron Microscopy 41 72 .
Xing Zhang & Z. Hong Zhou. (2011) Limiting factors in atomic resolution cryo electron microscopy: No simple tricks. Journal of Structural Biology 175:3, pages 253-263.
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D J H Cockayne. (2010) The nanoworld through aberration corrected lenses. Journal of Physics: Conference Series 241, pages 012001.
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M. D. Rossell, R. Erni, M. Asta, V. Radmilovic & U. Dahmen. (2009) Atomic-resolution imaging of lithium in precipitates . Physical Review B 80:2.
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Richard Wirth. (2009) Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale. Chemical Geology 261:3-4, pages 217-229.
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Larissa F. Dobrzhinetskaya & Richard Wirth. 2010. New Frontiers in Integrated Solid Earth Sciences. New Frontiers in Integrated Solid Earth Sciences 373 395 .
Christine E. Kliewer. 2009. Zeolite Chemistry and Catalysis. Zeolite Chemistry and Catalysis 169 196 .
Michael A. O’Keefe. (2008) Seeing atoms with aberration-corrected sub-Ångström electron microscopy. Ultramicroscopy 108:3, pages 196-209.
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David J. Smith. (2008) Ultimate resolution in the electron microscope?. Materials Today 11, pages 30-38.
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Karsten Tillmann, Lothar Houben, Andreas Thust & Knut Urban. (2006) Spherical-aberration correction in tandem with the restoration of the exit-plane wavefunction: synergetic tools for the imaging of lattice imperfections in crystalline solids at atomic resolution. Journal of Materials Science 41:14, pages 4420-4433.
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C. Kisielowski. 2006. Electron Crystallography. Electron Crystallography 17 30 .
Z. Liliental-Weber, T. Tomaszewicz, D. Zakharov & M.A. O’Keefe. (2005) Defects in p-doped bulk GaN crystals grown with Ga polarity. Journal of Crystal Growth 281:1, pages 125-134.
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Michael A. O'Keefe, Lawrence F. Allard & Douglas A. Blom. (2005) HRTEM imaging of atoms at sub-Ångström resolution. Microscopy 54:3, pages 169-180.
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A.C. Diebold & W.W. Chism. 2005. High Dielectric Constant Materials. High Dielectric Constant Materials 483 520 .
Z. Liliental-Weber, T. Tomaszewicz, D. Zakharov, J. Jasinski & M. A. O'Keefe. (2004) Atomic Structure of Defects in GaN:Mg Grown with Ga Polarity. Physical Review Letters 93:20.
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Michael A. O'Keefe. (2004) Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope. Microscopy and Microanalysis 10:4, pages 397-399.
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Angus I. Kirkland & Rüdiger R. Meyer. (2004) “Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. Microscopy and Microanalysis 10:4, pages 401-413.
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Michael A O'Keefe, Crispin JD Hetherington & E Chris Nelson. (2004) Sub-Ångstrom Resolution with a Mid-Voltage TEM. Microscopy Today 12:3, pages 28-29.
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Nobuharu Nakajima. (2004) Lensless imaging from diffraction intensity measurements by use of a noniterative phase-retrieval method. Applied Optics 43:8, pages 1710.
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Michael A. O'Keefe & Yang Shao-Horn. (2004) Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms. Microscopy and Microanalysis 10:1, pages 86-95.
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Yang Shao-Horn, Laurence Croguennec, Claude Delmas, E. Chris Nelson & Michael A. O'Keefe. (2003) Atomic resolution of lithium ions in LiCoO2. Nature Materials 2:7, pages 464-467.
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Jianwei Miao, Tetsu Ohsuna, Osamu Terasaki, Keith O. Hodgson & Michael A. O’Keefe. (2002) Atomic Resolution Three-Dimensional Electron Diffraction Microscopy. Physical Review Letters 89:15.
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J. C. H. Spence, U. Weierstall & M. Howells. (2002) Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffraction. Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 360:1794, pages 875-895.
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John Spence. (2002) Achieving atomic resolution. Materials Today 5:3, pages 20-33.
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