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Philosophical Magazine B Volume 39, 1979 - Issue 6
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Original Articles

Defect-controlled carrier transport in amorphous SiO2

G. Lucovsky Xerox Palo Alto Research Center, Palo Alto, California, 94304, U.S.A
Pages 531-540 | Received 14 Dec 1978, Accepted 24 Mar 1979, Published online: 01 Dec 2006

Citations (42)

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N.F. Mott, S. Rigo, F. Rochet & A.M. Stoneham. (1989) Oxidation of silicon. Philosophical Magazine B 60:2, pages 189-212.
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R. Meaudre & M. Meaudre. (1982) Bipolaron and single-polaron contributions to a.c. conduction in r.f. sputtered SiO2 films. Philosophical Magazine B 46:6, pages 647-657.
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J. Robertson. (1981) The electronic properties of silicon nitride. Philosophical Magazine B 44:2, pages 215-237.
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G. Lucovsky. (1980) Paramagnetic centres associated with bonding defects in v-SiO2 . Philosophical Magazine B 41:4, pages 457-467.
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G. Lucovsky. (1979) Spectroscopic evidence for valence-alternation-pair defect states in vitreous SiO2 . Philosophical Magazine B 39:6, pages 513-530.
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Articles from other publishers (37)

A. Stesmans & V.V. Afanas'ev. (2017) Defect correlated with positive charge trapping in functional HfO2 layers on (100)Si revealed by electron spin resonance: Evidence for oxygen vacancy?. Microelectronic Engineering 178, pages 112-115.
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A.G. Kalampounias, N. Bouropoulos, K. Katerinopoulou & S.N. Yannopoulos. (2008) Textural and structural studies of sol–gel derived CaO- and MgO silica glasses. Journal of Non-Crystalline Solids 354:2-9, pages 749-754.
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L. P. Ginzburg & A. P. Zhilinskii. (2002) Charged defect diagnostics from luminescence spectra. Technical Physics 47:2, pages 200-205.
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A. Stesmans & F. Scheerlinck. (1995) Electron-spin-resonance analysis of the natural intrinsic EX center in thermal on Si . Physical Review B 51:8, pages 4987-4997.
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L.P. Ginzburg. (1994) Charged defects in vitreous silica. Journal of Non-Crystalline Solids 171:2, pages 164-171.
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A. Moguš-Milanković & Delbert E. Day. (1993) Thermally stimulated polarization and dc conduction in iron phosphate glasses. Journal of Non-Crystalline Solids 162:3, pages 275-286.
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F. L. Galeener, D. B. Kerwin, A. J. Miller & J. C. Mikkelsen. (1993) X-ray creation and activation of electron spin resonance in vitreous silica. Physical Review B 47:13, pages 7760-7779.
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Yuichi Watanabe, Hiroshi Kawazoe & Masayuki Yamane. (1988) Imperfections in amorphous chalcogenides. II. Detection and structure determination of neutral defects in As-S, Ge-S, and Ge-As-S glasses. Physical Review B 38:8, pages 5668-5676.
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A. Singh & C. A. Hogarth. (1988) Structural investigations of SiO-CeO2 thin films. Journal of Materials Science 23:5, pages 1758-1763.
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Biprodas Dutta, D.L. Kinser, R.H. MagruderIIIIII & R.A. Weeks. (1987) Experimental evidence for the existence of intimate valance alternation pair defects in GeO2 glasses. Journal of Non-Crystalline Solids 95-96, pages 389-396.
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J. M. Baranowski, I. Strzalkowski, M. Marczewski & M. Kowalski. (1987) π-bonded model of an oxygen-vacancy center in SiO2. Journal of Applied Physics 61:8, pages 2904-2909.
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Bjørn O. Mysen & David Virgo. (1986) Volatiles in silicate melts at high pressure and temperature. Chemical Geology 57:3-4, pages 303-331.
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Arthur H. Edwards & W. Beall Fowler. 1986. Structure and Bonding in Noncrystalline Solids. Structure and Bonding in Noncrystalline Solids 139 155 .
E.A. Davis. (1985) Defects and associated electronic states in amorphous semiconductors. Journal of Non-Crystalline Solids 71:1-3, pages 113-123.
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Adalbert Feltz. 1985. Physics of Disordered Materials. Physics of Disordered Materials 203 213 .
K Hubner. (1984) Valence-alternation-pair model for interface states, fixed oxide charges, radiation defects, and impurities of the Si-SiO 2 interface . Journal of Physics C: Solid State Physics 17:35, pages 6553-6559.
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M. Meaudre & R. Meaudre. (1984) Electrical transport in RF-sputtered SiO2 films A review. Journal of Non-Crystalline Solids 68:2-3, pages 281-299.
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Efstratios I. Kamitsos & William M. RisenJr.Jr.. (1984) Vibrational spectra of single and mixed alkali pentasilicate glasses. Journal of Non-Crystalline Solids 65:2-3, pages 333-354.
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M. Meaudre & R. Meaudre. (1984) Mechanisms for ac conduction in rf sputtered Si films . Physical Review B 29:12, pages 7014-7019.
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A.R Silin, P.J Bray & J.C MikkelsenJr.Jr.. (1984) High temperature intrinsic defects in fused silica. Journal of Non-Crystalline Solids 64:1-2, pages 185-193.
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K. L. Ngai. 1984. Polarons and Excitons in Polar Semiconductors and Ionic Crystals. Polarons and Excitons in Polar Semiconductors and Ionic Crystals 383 418 .
Bjørn O. Mysen. (1983) The solubility mechanisms of volatiles in silicate melts and their relations to crystal-andesite liquid equilibria. Journal of Volcanology and Geothermal Research 18:1-4, pages 361-385.
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Eoin P. O'Reilly & John Robertson. (1983) Theory of defects in vitreous silicon dioxide. Physical Review B 27:6, pages 3780-3795.
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H. KösterJr.Jr., I. N. Iassievich & K. Hübner. (2006) Thermally‐stimulated excitation of electrons from deep traps of insulators in electric fields. physica status solidi (b) 115:2, pages 409-414.
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Koichi Shimakawa & Akihiro Kondo. (1983) Model for ac conduction in amorphous Si films . Physical Review B 27:2, pages 1136-1140.
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Raymond Jeanloz. (1983) Mineral and melt physics a summary of research in the United States, 1979–1982. Reviews of Geophysics 21:6, pages 1487.
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Alessandro Bertoluzza, Concezio Fagnano, Maria Antonietta Morelli, Vittorio Gottardi & Massimo Guglielmi. (1982) Raman and infrared spectra on silica gel evolving toward glass. Journal of Non-Crystalline Solids 48:1, pages 117-128.
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Bjørn O. Mysen, David Virgo & Friedrich A. Seifert. (1982) The structure of silicate melts: Implications for chemical and physical properties of natural magma. Reviews of Geophysics 20:3, pages 353.
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A. Feltz. (1981) Glass formation and structure of chalcogenide systems XXIV. The model of charged dangling bonds in liquid and vitreous inorganic systems. Journal of Non-Crystalline Solids 45:3, pages 355-369.
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F. L. Galeener & J. C. Mikkelsen. (1981) Vibrational dynamics in -substituted vitreous Si . Physical Review B 23:10, pages 5527-5530.
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W. Y. Ching. (1981) Microscopic Calculation of Localized Electron States in an Intrinsic Glass. Physical Review Letters 46:9, pages 607-610.
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F.L. Galeener & J.C. MikkelsenJr.Jr.. (1981) Raman studies of the thermal oxide of silicon. Solid State Communications 37:9, pages 719-723.
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J. Robertson. 1981. Recent Developments in Condensed Matter Physics. Recent Developments in Condensed Matter Physics 239 245 .
J. C. MikkelsenJr.Jr. & F. L. Galeener. (1980) Steam thermal SiO2: Preparation and Raman characterization of free-standing films. Applied Physics Letters 37:8, pages 712-714.
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N.F. Mott. (1980) Charged defects in vitreous silica. Journal of Non-Crystalline Solids 40:1-3, pages 1-6.
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Gerald Lucovsky & D.J. Chadi. 1980. The Physics of MOS Insulators. The Physics of MOS Insulators 301 305 .
K.L. Ngai, Xiyi Huang & Fu-sui Liu. 1980. The Physics of MOS Insulators. The Physics of MOS Insulators 44 48 .

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