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Philosophical Magazine B Volume 64, 1991 - Issue 2
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Original Articles

Electrical conduction mechanisms in electrochemically formed amorphous films of Nb2O5

G. Jouv Laboratoire de Métallurgie Strucurale, URA 1107-ISMA, Université Paris-Sud, Bǎt 413, 91 405, Orsay Cedex, France
Pages 207-218 | Received 12 Nov 1990, Accepted 27 Dec 1990, Published online: 20 Aug 2006

Citations (7)

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G. Jouve. (2000) Electrochemical breakdown in thin Nb2O5 films. Philosophical Magazine B 80:8, pages 1507-1515.
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Articles from other publishers (6)

Jia Min Ang, Putu Andhita Dananjaya, Calvin Ching Ian Ang, Gerard Joseph Lim & Wen Siang Lew. (2023) Strain-induced degradation and recovery of flexible NbOx-based threshold switching device. Scientific Reports 13:1.
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W. Hzez, H. Rahmouni, E. Dhahri & K. Khirouni. (2017) Dielectric properties of niobium-based oxide. Journal of Alloys and Compounds 725, pages 342-348.
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C. Nico, T. Monteiro & M.P.F. Graça. (2016) Niobium oxides and niobates physical properties: Review and prospects. Progress in Materials Science 80, pages 1-37.
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B C Yadav & M Singh. (2010) Morphological and Humidity Sensing Investigations on Niobium, Neodymium, and Lanthanum Oxides. IEEE Sensors Journal 10:11, pages 1759-1766.
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. 1995. Handbook of Inorganic Electrochromic Materials. Handbook of Inorganic Electrochromic Materials 527 616 .
M Jimenez, R J Noer, G Jouve, C Antoine, J Jodet & B Bonin. (1993) Electron field emission from selectively contaminated cathodes. Journal of Physics D: Applied Physics 26:9, pages 1503-1509.
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