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Philosophical Magazine B Volume 67, 1993 - Issue 5
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Original Articles

Voltage and temperature dependence of silicon high-order Laue zone line positions

C. J. Rossouw Division of Materials Science and Technology, Commonwealth Scientific and Industrial Research Organization, Locked Bag 33, Clayton, Victoria, 3168, Australia
&
P. R. Miller Division of Materials Science and Technology, Commonwealth Scientific and Industrial Research Organization, Locked Bag 33, Clayton, Victoria, 3168, Australia
Pages 733-745 | Received 28 Jul 1992, Accepted 21 Oct 1992, Published online: 20 Aug 2006

Citations (7)

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Read on this site (1)

C.J. Rossouw, M.A. Gibson & C.T. Forwood. (1996) Convergent beam electron diffraction zeroth order Laue zone and higher order Laue zone analysis of order in TiAl alloys. Philosophical Magazine A 73:1, pages 187-201.
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Articles from other publishers (6)

C.L. Zheng & J. Etheridge. (2013) Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction. Ultramicroscopy 125, pages 49-58.
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C.J. Rossouw, S.L. Dudarev, T.W. Josefsson & L.J. Allen. (1998) Transmission resonance diffraction and low impact parameter inelastic scattering of high-energy electrons. Ultramicroscopy 72:1-2, pages 17-29.
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C.J. Rossouw, M.A. Gibson & C.T. Forwood. (1996) Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys. Ultramicroscopy 66:3-4, pages 193-209.
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C.J. Rossouw. (1995) Incoherent contrast under dynamical diffraction conditions. Ultramicroscopy 58:2, pages 211-222.
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T. W. Josefsson, L. J. Allen, P. R. Miller & C. J. Rossouw. (1994) K -shell ionization under zone-axis electron-diffraction conditions . Physical Review B 50:10, pages 6673-6684.
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C. Deininger, G. Necker & J. Mayer. (1994) Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction. Ultramicroscopy 54:1, pages 15-30.
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