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Philosophical Magazine B Volume 68, 1993 - Issue 5
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Original Articles

Characterization of interface properties in a-Si:H/a-SixC1−x:H multilayers by the constant photocurrent method

F. Wang Technical University of Munich, Physics Department, E16 85747, Garching, F. R., Germany
,
T. Fischer Technical University of Munich, Physics Department, E16 85747, Garching, F. R., Germany
,
T. Muschik Technical University of Munich, Physics Department, E16 85747, Garching, F. R., Germany
&
R. Schwarz Technical University of Munich, Physics Department, E16 85747, Garching, F. R., Germany
Pages 737-751 | Received 21 Apr 1993, Accepted 01 Jul 1993, Published online: 20 Aug 2006

Citations (10)

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Read on this site (2)

J.P. Conde, M. Silva, V. Chu, H. Gleskova, K. Vasanth, S. Wagner, D.S. Shen, P. Popovicf, S. Grebner & R. Schwarz. (1996) In-plane photoconductivity in amorphous silicon doping multilayers. Philosophical Magazine B 74:4, pages 331-347.
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D. Nesheva, E. Vateva, Z. Levi & D. Arsova. (1995) Interface and structural disorder changes in Se/CdSe multilayers. Philosophical Magazine B 72:1, pages 67-73.
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Articles from other publishers (8)

Kriti Sharma, Poonam, G. S. S. Saini & S. K. Tripathi. (2018) A comparative study of transport properties of copper doped cadmium selenide thin films at two dopant concentrations. Journal of Materials Science: Materials in Electronics 29:11, pages 9596-9604.
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Kriti Sharma, Alaa S. Al-Kabbi, G.S.S. Saini & S.K. Tripathi. (2013) Thermally and optically induced effects on sub-band gap absorption in nanocrystalline CdSe (nc-CdSe) thin films. Current Applied Physics 13:6, pages 964-968.
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D. Nesheva, A. Petrova, S. Stavrev, Z. Levi & Z. Aneva. (2007) Thin film semiconductor nanomaterials and nanostructures prepared by physical vapour deposition: An atomic force microscopy study. Journal of Physics and Chemistry of Solids 68:5-6, pages 675-680.
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R. Schwarz, M. Fernandes, J. Martins, A. Fantoni, M. Vieira, P. Sanguino, C.N. Carvalho & T. Muschik. (2004) Sensor element for a metal–insulator–semiconductor camera system (MISCam). Sensors and Actuators A: Physical 115:2-3, pages 331-335.
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Diana Nesheva. 2001. Handbook of Surfaces and Interfaces of Materials. Handbook of Surfaces and Interfaces of Materials 239 279 .
D Nesheva, Z Levi, Z Aneva, V Nikolova & H Hofmeister. (2000) Experimental studies on the defect states at the interface between nanocrystalline CdSe and amorphous SiO x . Journal of Physics: Condensed Matter 12:5, pages 751-759.
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F. Wang, T. Fischer & R. Schwarz. (1994) Effect of the barrier thickness on interface defect density in amorphous-Si:H/amorphous-Si1− x C x :H multilayers . Applied Physics Letters 65:22, pages 2798-2800.
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G Carlotti, G Socino, Hua Xia, K J Chen, Z F Li, Wei Zhang & X K Zhang. (1994) The elastic behaviour of finite-stage quasiperiodic Fibonacci a-Si:H/a-Si 1-x C x :H multilayers . Journal of Physics: Condensed Matter 6:31, pages 6095-6102.
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