Advanced search
Publication Cover
The Imaging Science Journal Volume 45, 1997 - Issue 2
Submit an article Journal homepage
8
Views
6
CrossRef citations to date
0
Altmetric
Original Articles

An Ionization Type Semiconductor Photographic System Based on High-resistivity Semiconductor Film

B. G. SalamovPhysics Department, Faculty of Arts and Sciences, Gazi University, 06500, Teknikokullar, Ankara, Turkey; On leave from Physics Department, Baku State University, Azerbaijan
Pages 69-71 | Received 15 Oct 1996, Published online: 08 Jul 2016

Citations (6)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (4)

B G Salamov. (2009) Semiconductor gas discharge IR image converter with internal image amplification. The Imaging Science Journal 57:3, pages 152-161.
Read now
B G Salamov. (2004) Light emission features in ionization-type semiconductor photographic system. The Imaging Science Journal 52:4, pages 225-233.
Read now
B G Salamov, H Yücel Kurt & E Kurt. (2003) An analysis of the spatial homogeneity of a photodetector surface in an infrared image converter using the fractal dimension. The Imaging Science Journal 51:4, pages 187-197.
Read now
H Yucel Kurt, E Kurt & B G Salamov. (2001) An analysis of the image homogeneity in an ionization-type infrared image converter using the fractal dimension. The Imaging Science Journal 49:4, pages 205-212.
Read now

Articles from other publishers (2)

B G Salamov. (2004) Behaviour of light emission in a semiconductor gas discharge IR image converter. Journal of Physics D: Applied Physics 37:18, pages 2496-2501.
Crossref
H. Yücel Kurt, E. Kurt & B. G. Salamov. (2004) Fractal processing for an analysis of the quality and resistivity of large semiconductor plates. Crystal Research and Technology 39:9, pages 743-753.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.