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Philosophical Magazine Volume 83, 2003 - Issue 31-34: Multiscale Modelling of Nano- and Micro-mechanics of Materials
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Original Articles

Critical thickness for dislocation generation in epitaxial piezoelectric thin films

Biao Wang† Department of Mechanical Engineering, The Hong Kong Polytechnic University, Hong Kong SAR, ChinaView further author information
,
C. H. Woo Department of Mechanical Engineering, The Hong Kong Polytechnic University, Hong Kong SAR, China
,
Qingping Sun Department of Mechanical Engineering, The Hong Kong University of Science and Technology, Hong Kong SAR, China
&
T. X. Yu Department of Mechanical Engineering, The Hong Kong University of Science and Technology, Hong Kong SAR, China
Pages 3753-3764 | Received 17 Jun 2002, Accepted 25 May 2003, Published online: 12 May 2010

Citations (12)

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Read on this site (2)

SidneyB. Lang. (2006) Guide to the Literature of Piezoelectricity and Pyroelectricity. 26. Ferroelectrics 332:1, pages 227-321.
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SidneyB. Lang. (2006) Guide to the Literature of Piezoelectricity and Pyroelectricity. 25. Ferroelectrics 330:1, pages 103-182.
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Articles from other publishers (10)

Maksym Myronov, Gerard Colston, Jack Davies & Laura Michael. (2022) A fast approach to measuring the thickness uniformity of a homoepilayer grown on to any type of silicon wafer. Semiconductor Science and Technology 37:6, pages 065003.
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Yangfan Hu. (2018) Effect of Misfit Strains on the Skyrmion Crystal Phase in Epitaxial Thin Films of Helimagnets. physica status solidi (RRL) - Rapid Research Letters 12:10, pages 1800247.
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D. Mishra, Y.-H. Cho, M.-B. Shim, S. Hwang, S. Kim, C.Y. Park, S.Y. Seo, S.-H. Yoo, S.-H. Park & Y.E. Pak. (2015) Effect of piezoelectricity on critical thickness for misfit dislocation formation at InGaN/GaN interface. Computational Materials Science 97, pages 254-262.
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Biao WangBiao Wang. 2013. Mechanics of Advanced Functional Materials. Mechanics of Advanced Functional Materials 269 320 .
Tao Tao, Zhao Zhang, Lian Liu, Hui Su, Zili Xie, Rong Zhang, Bin Liu, Xiangqian Xiu, Yi Li, Ping Han, Yi Shi & Youdou Zheng. (2011) Surface morphology and composition studies in InGaN/GaN film grown by MOCVD. Journal of Semiconductors 32:8, pages 083002.
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Kun Zhou & Mao S. Wu. (2009) Elastic fields due to an edge dislocation in an isotropic film-substrate by the image method. Acta Mechanica 211:3-4, pages 271-292.
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Yue Zheng, Biao Wang & Chung-Ho Woo. (2009) Thermodynamic modeling of nanoscale ferroelectric systems. Acta Mechanica Solida Sinica 22:6, pages 524-549.
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Yue Zheng, Biao Wang & C.H. Woo. (2007) Effects of interface dislocations on properties of ferroelectric thin films. Journal of the Mechanics and Physics of Solids 55:8, pages 1661-1676.
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Yue Zheng, Biao Wang & C. H. Woo. (2006) Critical thickness for dislocation generation during ferroelectric transition in thin film on a compliant substrate. Applied Physics Letters 89:8.
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Ai Kah Soh, Jin-xi Liu, Kwok Lun Lee & Dai-ning Fang. (2005) Moving dislocations in general anisotropic piezoelectric solids. physica status solidi (b) 242:4, pages 842-853.
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