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Philosophical Magazine Volume 86, 2006 - Issue 28
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Original Articles

Threading dislocations in epitaxial ferroelectric PbZr0.2Ti0.8O3 films and their effect on polarization backswitching

I. Vrejoiu Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), GermanyCorrespondence[email protected]
,
G. Le Rhun Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), Germany
,
N. D. Zakharov Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), Germany
,
D. Hesse Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), Germany
,
L. Pintilie Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), Germany
&
M. Alexe Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Salle), Germany
Pages 4477-4486 | Received 16 Jan 2006, Accepted 22 Mar 2006, Published online: 21 Feb 2007

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Y.L. Zhu, X. Wang, M.J. Zhuo, Y.Q. Zhang & X.L. Ma. (2010) Dislocations in charge-ordered Pr0.5Ca0.5MnO3 epitaxial thin films prepared by a two-step growth technique. Philosophical Magazine Letters 90:5, pages 323-336.
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Y.L. Zhu, S.J. Zheng, X.L. Ma, L. Feigl, M. Alexe, D. Hesse & I. Vrejoiu. (2010) Microstructural evolution of [PbZr Ti1– O3/PbZr Ti1– O3] epitaxial multilayers (x/y = 0.2/0.4, 0.4/0.6)–dependence on layer thickness. Philosophical Magazine 90:10, pages 1359-1372.
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