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Philosophical Magazine Volume 86, 2006 - Issue 29-31: 50 Years of TEM of Dislocations
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Original Articles

LACBED characterization of dislocation loops

J. P. Morniroli Laboratoire de Métallurgie Physique et Génie des Matériaux, UMR CNRS 8517, USTL and ENSCL, Cité Scientifique, 59500 Villeneuve d’Ascq, FranceCorrespondence[email protected]
,
R. K. W. Marceau Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, NSW 2006, Australia
,
S. P. Ringer Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, NSW 2006, Australia
&
L. Boulanger Services de Recherches de Métallurgie Physique, CEA/SACLAY, 91191 Gif Sur Yvette, France
Pages 4883-4900 | Received 12 Dec 2005, Accepted 10 Mar 2006, Published online: 21 Feb 2007

Citations (10)

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Read on this site (1)

Jason Paul Hadorn, Ryohei Tanuma, Isaho Kamata & Hidekazu Tsuchida. (2020) Direct evaluation of threading dislocations in 4H-SiC through large-angle convergent beam electron diffraction. Philosophical Magazine 100:2, pages 194-216.
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Articles from other publishers (9)

Heiko Groiss. (2019) Dislocation Analysis in SiGe Heterostructures by Large-Angle Convergent Beam Electron Diffraction. Crystals 10:1, pages 5.
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Jian-Min Zuo. 2019. Springer Handbook of Microscopy. Springer Handbook of Microscopy 905 969 .
Ryo Hattori, Osamu Oku, Ryuichi Sugie, Kazutsugu Murakami & Masaaki Kuzuhara. (2018) Optical discrimination of threading dislocations in 4H-SiC epitaxial layer by phase-contrast microscopy. Applied Physics Express 11:7, pages 075501.
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Jian Min Zuo & John C.H. SpenceJian Min Zuo & John C. H. Spence. 2017. Advanced Transmission Electron Microscopy. Advanced Transmission Electron Microscopy 231 295 .
Y.M. Eggeler, J. Müller, M.S. Titus, A. Suzuki, T.M. Pollock & E. Spiecker. (2016) Planar defect formation in the γ′ phase during high temperature creep in single crystal CoNi-base superalloys. Acta Materialia 113, pages 335-349.
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Heiko Groiss, Martin Glaser, Anna Marzegalli, Fabio Isa, Giovanni Isella, Leo Miglio & Friedrich Schäffler. (2015) Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction. Microscopy and Microanalysis 21:3, pages 637-645.
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Yoshihiro Sugawara, Yong Zhao Yao, Yukari Ishikawa, Katsunori Danno, Hiroshi Suzuki, Takeshi Bessho, Satoshi Yamaguchi, Koichi Nishikawa & Yuichi Ikuhara. (2014) Characterization of Threading Edge Dislocation in 4H-SiC by X-Ray Topography and Transmission Electron Microscopy. Materials Science Forum 778-780, pages 366-369.
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Yoshihiro Sugawara, Y. Yao, Yukari Ishikawa, Katsunori Danno, Hiroshi Suzuki, Takeshi Bessho, Yoichiro Kawai & Yuichi Ikuhara. (2012) Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy. Materials Science Forum 725, pages 11-14.
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S. GUSTAFSSON & L.K.L. FALK. (2009) Defocus convergent beam electron diffraction analysis of dislocations in mullite. Journal of Microscopy 233:2, pages 346-351.
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