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Philosophical Magazine Volume 86, 2006 - Issue 29-31: 50 Years of TEM of Dislocations
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Original Articles

Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography

J. S. Barnard Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
,
J. Sharp Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
,
J. R. Tong Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
&
P. A. Midgley Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UKCorrespondence[email protected]
Pages 4901-4922 | Received 06 Mar 2006, Accepted 20 Apr 2006, Published online: 21 Feb 2007

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Kazuhisa Sato, Shunya Tashiro, Shuhei Matsunaga, Yohei Yamaguchi, Takanori Kiguchi & Toyohiko J. Konno. (2018) Evolution of long-period stacking order (LPSO) in Mg97Zn1Gd2 cast alloys viewed by HAADF-STEM multi-scale electron tomography. Philosophical Magazine 98:21, pages 1945-1960.
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J.S. Barnard, A.S. Eggeman, J. Sharp, T.A. White & P.A. Midgley. (2010) Dislocation electron tomography and precession electron diffraction – minimising the effects of dynamical interactions in real and reciprocal space. Philosophical Magazine 90:35-36, pages 4711-4730.
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S. Benlekbir, T. Epicier, M. Bausach, M. Aouine & G. Berhault. (2009) STEM HAADF electron tomography of palladium nanoparticles with complex shapes. Philosophical Magazine Letters 89:2, pages 145-153.
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Kazuhisa Sato & Hidehiro Yasuda. (2018) Probing Crystal Dislocations in a Micrometer-Thick GaN Film by Modern High-Voltage Electron Microscopy. ACS Omega 3:10, pages 13524-13529.
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Mao-hua LI, Yan-qing YANG, Bin HUANG, Xian LUO, Wei ZHANG, Ming HAN & Ji-gang RU. (2014) Development of advanced electron tomography in materials science based on TEM and STEM. Transactions of Nonferrous Metals Society of China 24:10, pages 3031-3050.
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P. H. Weidlich, M. Schnedler, V. Portz, H. Eisele, R. E. Dunin-Borkowski & Ph. Ebert. (2014) Meandering of overgrown v-shaped defects in epitaxial GaN layers. Applied Physics Letters 105:1.
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Alexandre Mussi, Patrick Cordier, Sylvie Demouchy & Claude Vanmansart. (2014) Characterization of the glide planes of the [001] screw dislocations in olivine using electron tomography. Physics and Chemistry of Minerals 41:7, pages 537-545.
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G.S. Liu, S.D. House, J. Kacher, M. Tanaka, K. Higashida & I.M. Robertson. (2014) Electron tomography of dislocation structures. Materials Characterization 87, pages 1-11.
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Josh Kacher, Grace Liu & IM Robertson. 2012. 1 st International Conference on 3D Materials Science . 1 st International Conference on 3D Materials Science 209 214 .
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J. S. Barnard, J. H. Sharp, S. Hata, M. Mitsuhara, K. Kaneko & K. Higashida. (2012) 3-dimensional imaging of dislocation microstructures by electron beams. MRS Proceedings 1421.
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Josh Kacher, Grace Liu & I M Robertson. 2016. Proceedings of the 1st International Conference on 3D Materials Science. Proceedings of the 1st International Conference on 3D Materials Science 209 214 .
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J.M. Rebled, Ll. Yedra, S. Estradé, J. Portillo & F. Peiró. (2011) A new approach for 3D reconstruction from bright field TEM imaging: Beam precession assisted electron tomography. Ultramicroscopy 111:9-10, pages 1504-1511.
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Masaki Tanaka, Sunao Sadamatsu, Hiroto Nakamura & Kenji Higashida. (2011) The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals. MATERIALS TRANSACTIONS 52:3, pages 352-357.
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Paul A. Midgley & Matthew Weyland. 2011. Scanning Transmission Electron Microscopy. Scanning Transmission Electron Microscopy 353 392 .
J H Sharp, J S Barnard & P A Midgley. (2010) Obstacles and optimisation in weak-beam dark-field tomography of defects. Journal of Physics: Conference Series 241, pages 012007.
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Satoshi Hata, Masatoshi Mitsuhara, Masaki Tanaka, Hiroya Miyazaki, Ken-ichi Ikeda, Kenji Kaneko, Hideharu Nakashima, Kenji Higashida & Syo Matsumura. (2010) Three-dimensional Visualization of Lattice Defects by Electron Tomography. Materia Japan 49:6, pages 274-279.
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J H Sharp, J S Barnard, K Kaneko, K Higashida & P A Midgley. (2008) Dislocation tomography made easy: a reconstruction from ADF STEM images obtained using automated image shift correction. Journal of Physics: Conference Series 126, pages 012013.
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Satoshi Hata, Kosuke Kimura, Hongye Gao, Syo Matsumura, Minoru Doi, Tomokazu Moritani, Jonathan S. Barnard, Jenna R. Tong, Jo H. Sharp & Paul A. Midgley. (2008) Electron Tomography Imaging and Analysis of γ ′ and γ Domains in Ni‐based Superalloys . Advanced Materials 20:10, pages 1905-1909.
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Masaki Tanaka, Masaki Honda, Masatoshi Mitsuhara, Satoshi Hata, Kenji Kaneko & Kenji Higashida. (2008) Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal. MATERIALS TRANSACTIONS 49:9, pages 1953-1956.
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Paul A. Midgley, Edmund P. W. Ward, Ana B. Hungría & John Meurig Thomas. (2007) Nanotomography in the chemical, biological and materials sciences. Chemical Society Reviews 36:9, pages 1477.
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