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Philosophical Magazine Volume 90, 2010 - Issue 33
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Original Articles

ADF STEM imaging of screw dislocations viewed end-on

E.C. Cosgriff Department of Materials, University of Oxford, Oxford, OX1 3PH, UK
,
P.D. Nellist Department of Materials, University of Oxford, Oxford, OX1 3PH, UKCorrespondence[email protected]
,
P.B. Hirsch Department of Materials, University of Oxford, Oxford, OX1 3PH, UK
,
Z. Zhou School of Chemistry, Cardiff University, Park Place, Cardiff, CF10 3AT, UK
&
D.J.H. Cockayne Department of Materials, University of Oxford, Oxford, OX1 3PH, UK
Pages 4361-4375 | Received 22 Mar 2010, Accepted 24 Jun 2010, Published online: 26 Aug 2010

Citations (11)

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P.B. Hirsch, J.G. Lozano, S. Rhode, M.K. Horton, M.A. Moram, S. Zhang, M.J. Kappers, C.J. Humphreys, A. Yasuhara, E. Okunishi & P.D. Nellist. (2013) The dissociation of the [+ ] dislocation in GaN. Philosophical Magazine 93:28-30, pages 3925-3938.
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Articles from other publishers (10)

Moonsang Lee, Hionsuck Baik, Wontaek Ryu, Yewon Jo, SeongYoung Kong & Mino Yang. (2018) Partial Edge Dislocations Comprised of Metallic Ga Bonds in Heteroepitaxial GaN. Nano Letters 18:8, pages 4866-4870.
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. 2018. Electron Beam-Specimen Interactions and Simulation Methods in Microscopy. Electron Beam-Specimen Interactions and Simulation Methods in Microscopy 105 163 .
Peter D. Nellist. (2017) Electron-optical sectioning for three-dimensional imaging of crystal defect structures. Materials Science in Semiconductor Processing 65, pages 18-23.
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Jian Min Zuo & John C.H. SpenceJian Min Zuo & John C. H. Spence. 2017. Advanced Transmission Electron Microscopy. Advanced Transmission Electron Microscopy 501 552 .
J G Lozano, M P Guerrero-Lebrero, A Yasuhara, E Okinishi, S Zhang, C J Humphreys, P L Galindo, P B Hirsch & P D Nellist. (2014) Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM. Journal of Physics: Conference Series 522, pages 012048.
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Andriy Lotnyk, David Poppitz, Jürgen W. Gerlach & Bernd Rauschenbach. (2014) Direct imaging of light elements by annular dark-field aberration-corrected scanning transmission electron microscopy. Applied Physics Letters 104:7.
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G.M. Cheng, W.Z. Xu, W.W. Jian, H. Yuan, M.H. Tsai, Y.T. Zhu, Y.F. Zhang & P.C. Millett. (2013) Dislocations with edge components in nanocrystalline bcc Mo. Journal of Materials Research 28:13, pages 1820-1826.
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Vincenzo Grillo & Enzo Rotunno. (2013) STEM_CELL: A software tool for electron microscopy: Part I—simulations. Ultramicroscopy 125, pages 97-111.
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Patrick Cordier. 2013. Minerals at the Nanoscale. Minerals at the Nanoscale 67 107 .
V Grillo, K Mueller, K Volz, F Glas, T Grieb & A Rosenauer. (2011) Strain, composition and disorder in ADF imaging of semiconductors. Journal of Physics: Conference Series 326, pages 012006.
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