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Tarık Asar, Burak Korkmaz & Süleyman Özçelik. (2016) Effect of platinum doping on the structural and electrical properties of SnO2 thin films. Journal of Experimental Nanoscience 11:16, pages 1285-1306.
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Ö. Berkün, M. Ulusoy, Ş. Altındal & B. Avar. (2023) On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer. Physica B: Condensed Matter 666, pages 415099.
Crossref
Crossref
Yasemin Şafak Asar, Ömer Sevgili & Şemsettin Altındal. (2023) Investigation of dielectric relaxation and ac conductivity in Au/(carbon nanosheet-PVP composite)/n-Si capacitors using impedance measurements. Journal of Materials Science: Materials in Electronics 34:10.
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S. Demirezen, H. G. Çetinkaya & Ş. Altındal. (2022) Doping rate, Interface states and Polarization Effects on Dielectric Properties, Electric Modulus, and AC Conductivity in PCBM/NiO:ZnO/p-Si Structures in Wide Frequency Range. Silicon 14:14, pages 8517-8527.
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Lütfi Bilal Tasyürek. (2022) The effects of frequency change on dielectric characteristics in dye-based organic layers. Optik 260, pages 169064.
Crossref
Crossref
Naveen Kumar, Seema Azad & Subhash Chand. (2022) Fabrication and electrical characterization of solution processed Ni/MgO/p-Si/Al MIS diodes. Applied Physics A 128:3.
Crossref
Crossref
Yunus Özen. (2020) Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range. Silicon 13:9, pages 3011-3016.
Crossref
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Ömer Faruk Bakkaloğlu, Kadir Ejderha, Hasan Efeoğlu, Şükrü Karataş & Abdülmecit Türüt. (2021) Temperature dependence of electrical parameters of the Cu/n-Si metal semiconductor Schottky structures. Journal of Molecular Structure 1224, pages 129057.
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Crossref
M. Benhaliliba, T. Asar & S. Özçelik. (2020) Negative capacitance within forward biasing voltage of organic device at higher frequencies. Optik 217, pages 164791.
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A. Ashery, H. Shaban, S.A. Gad & B.A. Mansour. (2020) Investigation of electrical and capacitance- voltage characteristics of GO/TiO2/n-Si MOS device. Materials Science in Semiconductor Processing 114, pages 105070.
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Ragab Mahani, A. Ashery & Mohamed M. M. Elnasharty. (2019) Frequency and Voltage Dependence of the Dielectric Properties of Ni/SiO2/P-Si (MOS) Structure. Silicon 12:8, pages 1879-1885.
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A. Ashery, S. A. Gad & H. Shaban. (2020) Frequency and temperature dependence of dielectric properties and capacitance–voltage in GO/TiO2/n-Si MOS device. Applied Physics A 126:7.
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M. YILDIRIM & A. KOCYIGIT. (2020) A SYSTEMATIC STUDY ON THE DIELECTRIC RELAXATION, ELECTRIC MODULUS AND ELECTRICAL CONDUCTIVITY OF Al/Cu:TiO2∕n-Si (MOS) STRUCTURES/CAPACITORS. Surface Review and Letters, pages 1950217.
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Mehmet Can ÖZDEMİR, Ömer SEVGİLİ, İkram ORAK & Abdülmecit TÜRÜT. (2020) Arayüzey Doğal Oksit Tabakalı Al/p-Si/Al Yapıların Dielektrik Karakteristiklerine Ölçüm Frekansının EtkileriThe Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer. Iğdır Üniversitesi Fen Bilimleri Enstitüsü Dergisi 10:1, pages 91-100.
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Mehmet Okan Erdal, Adem Kocyigit & Murat Yıldırım. (2019) Temperature dependent current-voltage characteristics of Al/TiO2/n-Si and Al/Cu:TiO2/n-Si devices. Materials Science in Semiconductor Processing 103, pages 104620.
Crossref
Crossref
Yosef Badalı, Serhat Koçyığıt, Ibrahım Uslu & Şemsettın Altindal. (2019) Dielectric properties of $$\hbox {Ag/Ru}_{0.03}$$–PVA/n-Si structures. Bulletin of Materials Science 42:5.
Crossref
Crossref
K. Omri, A. Alyamani & L. El Mir. (2019) Surface morphology, microstructure and electrical properties of Ca-doped ZnO thin films. Journal of Materials Science: Materials in Electronics 30:17, pages 16606-16612.
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Mehmet Okan Erdal, Murat Yıldırım & Adem Kocyigit. (2019) A comparison of the electrical characteristics of TiO2/p-Si/Ag, GNR-TiO2/p-Si/Ag and MWCNT-TiO2/p-Si/Ag photodiodes. Journal of Materials Science: Materials in Electronics 30:14, pages 13617-13626.
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Rainer Schmidt, Patrick Mayrhofer, Ulrich Schmid & Achim Bittner. (2019) Impedance spectroscopy of Al/AlN/n-Si metal-insulator-semiconductor (MIS) structures. Journal of Applied Physics 125:8.
Crossref
Crossref
Gülçin Ersöz Demir, İbrahim Yücedağ, Yashar Azizian-Kalandaragh & Şemsettin Altındal. (2018) Temperature and Interfacial Layer Effects on the Electrical and Dielectric Properties of Al/(CdS-PVA)/p-Si (MPS) Structures. Journal of Electronic Materials 47:11, pages 6600-6606.
Crossref
Crossref
Tarık Asar, Veysel Baran, Gürkan Kurtuluş, Meltem Dönmez & Süleyman Özçelik. (2018) Platinum doping effect on InO MSM IR photodetectors. Superlattices and Microstructures 122, pages 650-660.
Crossref
Crossref
Elif Maril, Serhat Orkun Tan, Semsettin Altindal & Ibrahim Uslu. (2018)
Evaluation of Electric and Dielectric Properties of Metal–Semiconductor Structures With 2% GC-Doped-(Ca
3
Co
4
Ga
0.001
O
x
) Interlayer
. IEEE Transactions on Electron Devices 65:9, pages 3901-3908.
Crossref
Crossref
Nalan Baraz, İbrahim Yücedağ, Yashar Azizian-Kalandaragh & Şemsettin Altındal. (2018) Determining electrical and dielectric parameters of Al/ZnS-PVA/p-Si (MPS) structures in wide range of temperature and voltage. Journal of Materials Science: Materials in Electronics 29:15, pages 12735-12743.
Crossref
Crossref
Yosef Badali, Şemsettin Altındal & İbrahim Uslu. (2018) Dielectric properties, electrical modulus and current transport mechanisms of Au/ZnO/n-Si structures. Progress in Natural Science: Materials International 28:3, pages 325-331.
Crossref
Crossref
Havva Elif Lapa, Ali Kökce, Ahmet Faruk Özdemir, İbrahim Uslu & Şemsettin Altindal. (2018) A comparative study on dielectric behaviours of Au/(Zn-doped PVA)/n-4H-SiC (MPS) structures with different interlayer thicknesses using impedance spectroscopy methods. Bulletin of Materials Science 41:3.
Crossref
Crossref
Perihan Durmuş, Çiğdem Bilkan & Mert Yıldırım. (2017) Effects of Frequency and Bias Voltage on Dielectric Properties and Electric Modulus of Au/Bi4Ti3O12/n-Si (MFS) Capacitors. Journal of Polytechnic, pages 1003-1008.
Crossref
Crossref
Rifat Capan & Asim K. Ray. (2017) Dielectric Measurements on Sol–Gel Derived Titania Films. Journal of Electronic Materials 46:11, pages 6646-6652.
Crossref
Crossref
Afsoun Nikravan, Yosef Badali, Şemsettin Altındal, İbrahim Uslu & İkram Orak. (2017) On the Frequency and Voltage-Dependent Profiles of the Surface States and Series Resistance of Au/ZnO/n-Si Structures in a Wide Range of Frequency and Voltage. Journal of Electronic Materials 46:10, pages 5728-5736.
Crossref
Crossref
S. A. Yerişkin, M. Balbaşı & İ. Orak. (2017) Frequency dependent electrical characteristics and origin of anomalous capacitance–voltage (C–V) peak in Au/(graphene-doped PVA)/n-Si capacitors. Journal of Materials Science: Materials in Electronics 28:11, pages 7819-7826.
Crossref
Crossref
Nejeh Hamdaoui & Lotfi Beji. (2017) Electrical characterization and dielectric impedance of Au/n-CdS/p-porous GaAs/p++-GaAs thin film structures. Journal of Applied Physics 121:18.
Crossref
Crossref
N. Novkovski, A. Paskaleva, A. Skeparovski & D. Spassov. (2016) Model based precise analysis of the injection currents in Al/ZrO2/Al2O3/ZrO2/SiO2/Si structures for use in charge trapping non-volatile memory devices. Materials Science in Semiconductor Processing 44, pages 30-37.
Crossref
Crossref
S. Abboudy, K. Alfaramawi & L. Abulnasr. (2016) Dielectric constant of moderately doped InP at low frequencies and temperatures. The European Physical Journal Plus 131:2.
Crossref
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