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Publication Cover
The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics
Series 8
Volume 26, 1972 - Issue 6
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Original Articles

Dislocation images in the high resolution scanning electron microscope

R. M. Stern Cavendish Laboratory, Cambridge, England; Department of Physics, Polytechnic Institute of Brooklyn, New York
,
T. Ichinokawa Department of Applied Physics, Waseda University, Shinjuku-ku, Toyko, Japan
,
S. Takashima J. E. O. L. Ltd., Tokyo, Japan
,
H. Hashimoto J. E. O. L. Ltd., Tokyo, Japan
&
S. Kimoto J. E. O. L. Ltd., Tokyo, Japan
Pages 1495-1499 | Published online: 20 Aug 2006

Citations (27)

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Read on this site (2)

P. Morin, M. Pitaval, D. Besnard & G. Fontaine. (1979) Electron–channelling imaging in scanning electron microscopy. Philosophical Magazine A 40:4, pages 511-524.
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T. Yamamoto, M. Mori & Y. Ishida. (1978) Contrast mechanisms in electron-channelling patterns and lattice-defect images obtained with a scanning electron microscope. Philosophical Magazine A 38:4, pages 439-461.
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Articles from other publishers (25)

M. Ben Saada, N. Gey, B. Beausir, X. Iltis, H. Mansour & N. Maloufi. (2017) Sub-boundaries induced by dislocational creep in uranium dioxide analyzed by advanced diffraction and channeling electron microscopy. Materials Characterization 133, pages 112-121.
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G. Naresh-Kumar, D. Thomson, M. Nouf-Allehiani, J. Bruckbauer, P.R. Edwards, B. Hourahine, R.W Martin & C. Trager-Cowan. (2016) Reprint of: Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing 55, pages 19-25.
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G. Naresh-Kumar, D. Thomson, M. Nouf-Allehiani, J. Bruckbauer, P.R. Edwards, B. Hourahine, R.W. Martin & C. Trager-Cowan. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing 47, pages 44-50.
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Stefan Zaefferer & Nahid-Nora Elhami. (2014) Theory and application of electron channelling contrast imaging under controlled diffraction conditions. Acta Materialia 75, pages 20-50.
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RANGA J. KAMALADASA, FANG LIU, LISA M. PORTER, ROBERT F. DAVIS, DANIEL D. KOLESKE, GREG MULHOLLAND, KENNETH A. JONES & YOOSUF N. PICARD. (2011) Identifying threading dislocations in GaN films and substrates by electron channelling. Journal of Microscopy 244:3, pages 311-319.
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Martin A. Crimp. (2006) Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast. Microscopy Research and Technique 69:5, pages 374-381.
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B.A Simkin & M.A Crimp. (1999) An experimentally convenient configuration for electron channeling contrast imaging. Ultramicroscopy 77:1-2, pages 65-75.
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Ludwig ReimerLudwig Reimer. 1998. Scanning Electron Microscopy. Scanning Electron Microscopy 207 251 .
Angus J. Wilkinson & Peter B. Hirsch. (1997) Electron diffraction based techniques in scanning electron microscopy of bulk materials. Micron 28:4, pages 279-308.
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David C Joy. (2011) Direct Defect Imaging in the High Resolution Sem. MRS Proceedings 183.
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Ludwig ReimerLudwig Reimer. 1985. Scanning Electron Microscopy. Scanning Electron Microscopy 227 271 .
David C. Joy, Dale E. Newbury & David L. Davidson. (1982) Electron channeling patterns in the scanning electron microscope. Journal of Applied Physics 53:8, pages R81-R122.
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A. HOWIE. 1978. Diffraction and Imaging Techniques in Material Science. Diffraction and Imaging Techniques in Material Science 457 509 .
L. Reimer. (2011) Scanning electron microscopy—present state and trends. Scanning 1:1, pages 3-16.
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M. I. De Vries & A. Mastenbroek. (1977) SEM observations of dislocation substructures around fatigue cracks in aisi type 304 stainless steel. Metallurgical Transactions A 8:9, pages 1497-1499.
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E. M. Schulson. (1977) Electron channelling patterns in scanning electron microscopy. Journal of Materials Science 12:6, pages 1071-1087.
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E. M. Schulson. (1977) Electron channelling patterns in scanning electron microscopy. Journal of Materials Science 12:6, pages 1071-1087.
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R. SINCLAIR. 1977. Properties and Microstructure. Properties and Microstructure 1 45 .
Ludwig Reimer & Gerhard PfefferkornLudwig Reimer & Gerhard Pfefferkorn. 1977. Raster-Elektronenmikroskopie. Raster-Elektronenmikroskopie 109 167 .
M. Pitaval, P. Morin, J. Baudry & G. Fontaine. (1976) Observation de défauts cristallins en microscopie électronique à balayage. Journal de Physique Lettres 37:11, pages 309-312.
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Rolf Sandström, Jonathan F Spencer & Colin J Humphreys. (1974) A theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy. Journal of Physics D: Applied Physics 7:7, pages 1030-1046.
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D. C. Joy, M. N. Thompson, G. R. Booker & W. H. J. Andersen. (1974) Scanning reflection electron micrographs of stacking faults in a Co-4wt% Ti alloy. Physica Status Solidi (a) 21:1, pages K1-K5.
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R.M. Stern, S. Takashima, H. Hashimoto, S. Kimoto & T. Ichinokawa. (1974) Dislocation images in high resolution scanning electron microscopy. Revue de Physique Appliquée 9:2, pages 385-388.
Crossref
R.M. Stern. (1974) The back scattering of electrons by crystals at low and high energies. Revue de Physique Appliquée 9:2, pages 377-384.
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M.N. Thompson. (2020) The Application of SEM Techniques to the Study of Crystal Defects. Proceedings, annual meeting, Electron Microscopy Society of America 31, pages 154-155.
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