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The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics
Series 8
Volume 35, 1977 - Issue 5
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Original Articles

Accurate microcrystallography using electron back-scattering patterns

J. A. Venables School of Mathematical and Physical Sciences, The University of Sussex, Falmer, Brighton, Sussex, BN1 9QH, England
&
R. Bin-jaya School of Mathematical and Physical Sciences, The University of Sussex, Falmer, Brighton, Sussex, BN1 9QH, England
Pages 1317-1332 | Received 03 Sep 1976, Accepted 13 Jan 1977, Published online: 13 Sep 2006

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D. J. Dingley & D. P. Field. (1997) Electron backscatter diffraction and orientation imaging microscopy. Materials Science and Technology 13:1, pages 69-78.
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