Advanced search
Publication Cover
The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics
Series 8
Volume 35, 1977 - Issue 3
Journal homepage
19
Views
33
CrossRef citations to date
0
Altmetric
Original Articles

Experimental and calculated images of planar defects at high resolution

D. S. Maclagan School of Physics, University of Melbourne, Parkville, Victoria, Australia, 3052
,
L. A. Bursill School of Physics, University of Melbourne, Parkville, Victoria, Australia, 3052
&
A. E. C. Spargo School of Physics, University of Melbourne, Parkville, Victoria, Australia, 3052
Pages 757-780 | Received 02 Jul 1976, Accepted 03 Nov 1976, Published online: 13 Sep 2006

Citations (33)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (15)

L.A. Bursill, J.L. Peng & L.N. Bourgeois. (2000) Imogolite: An aluminosilicate nanotube material. Philosophical Magazine A 80:1, pages 105-117.
Read now
B. Jiang, J.L. Peng & L.A. Bursill. (1998) Intergrowth defects and dielectric response of BaTiO3 nano-particles. Ferroelectrics 207:1, pages 587-610.
Read now
B. Jiang, J.L. Peng & L.A. Bursill. (1998) Surface structures and dielectric response of ultrafine BaTiO3 particles. Ferroelectrics 207:1, pages 445-463.
Read now
L.A. Bursill. (1997) Atomic resolution imaging of ferroelectric domains. Ferroelectrics 191:1, pages 129-134.
Read now
Fan Xudong, Qian Hua, Peng Julin & L.A. Bursill. (1995) HRTEM analysis of nanodomain textures in PMN. Integrated Ferroelectrics 9:1-3, pages 233-242.
Read now
L.A. Bursill & Peng Ju Lin. (1989) Monolayer reconstruction on polar surfaces of ruby. Philosophical Magazine A 60:3, pages 307-320.
Read now
J.N. Ness, W.M. Stobbs & T.F. Page. (1986) A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films. Philosophical Magazine A 54:5, pages 679-702.
Read now
J.C. Barry, L.A. Bursill & J.L. Hutchison. (1985) On the structure of {100} platelet defects in type la diamond. Philosophical Magazine A 51:1, pages 15-49.
Read now
A.R. Wilson & A.E. C. Spargo. (1982) Calculation of the scattering from defects using periodic continuation methods. Philosophical Magazine A 46:3, pages 435-449.
Read now
Peng Ju Lin & L.A. Bursill. (1982) High-resolution study of ferroelectric domain boundaries in lithium tantalate. Philosophical Magazine A 45:6, pages 911-928.
Read now
Kazuhiko Yoshida, Yukio Yamada, Heishiro Ota, L.A. Bursill & G.J. Wood. (1981) Electron microscope study of the Ti4O7 phase in an annealed titanium oxide evaporated film. Philosophical Magazine A 44:1, pages 73-90.
Read now
L.A. Bursill & G.J. Wood. (1978) Electron-optical imaging of Ti6O11 at 1·6 Å point-to-point resolution. Philosophical Magazine A 38:6, pages 673-689.
Read now
J.C. H. Spence, M.A. O'keefe & S. Iijima. (1978) On the thickness periodicity of atomic-resolution images of dislocation cores. Philosophical Magazine A 38:4, pages 463-482.
Read now
L.A. Bubsill, J.C. Barky & P.R. W. Hudson. (1978) Fresnel diffraction at {100} platelets in diamond: An attempt at defect structure analysis by high-resolution (3 Å) phase-contrast microscopy. Philosophical Magazine A 37:6, pages 789-812.
Read now
L.A. Bursill & J.C. Barry. (1977) High-resolution reflex images of defects in crystals. The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics 36:4, pages 797-810.
Read now

Articles from other publishers (18)

Earl J. KirklandEarl J. Kirkland. 2020. Advanced Computing in Electron Microscopy. Advanced Computing in Electron Microscopy 143 195 .
G. L. Song & L. A. Bursill. (2012) Electron Diffraction Study of α-AlMnSi Crystals Along Non-Crystallographic Zone Axes. International Journal of Modern Physics B 12:22, pages 2279-2303.
Crossref
L.A. Bursill, Hua Qian, JuLin Peng & X.D. Fan. (1995) Observation and analysis of nanodomain textures in the dielectric relaxor lead magnesium niobate. Physica B: Condensed Matter 216:1-2, pages 1-23.
Crossref
M.J. Hÿtch & W.M. Stobbs. (1994) Quantitative comparison of high resolution TEM images with image simulations. Ultramicroscopy 53:3, pages 191-203.
Crossref
M.J. Hytch & W.M. Stobbs. (1994) Quantitative criteria for the matching of simulations with experimental HREM images. Microscopy Microanalysis Microstructures 5:2, pages 133-151.
Crossref
M.J. Hÿtch & W.M. Stobbs. (1994) The use of non-linear characteristics of a lattice fringe image for the characterisation of imaging parameters. Ultramicroscopy 53:1, pages 63-72.
Crossref
W.C. Shih & W.M. Stobbs. (1991) The use of the Fresnel method for the characterisation of a short-period strained Ge/Si multilayer: I. Measurement of the average Ge/Si volume ratio. Ultramicroscopy 35:3-4, pages 197-215.
Crossref
W.C. Shih & W.M. Stoobs. (1990) The measurement of the roughness of W/Si multilayers using the Fresnel method. Ultramicroscopy 32:3, pages 219-239.
Crossref
Amanda K. Petford-Long, G.R. Booker & M. Hockly. (1989) The use of high resolution electron microscopy and image simulation to determine the sharpness of InP/GaInAs interfaces in multiple quantum-well structures. Ultramicroscopy 31:4, pages 385-397.
Crossref
Y. Kikuchi, K. Watanabe, S. Naitoh, K. Hiratsuka & H. Yamaguchi. (1988) HREM image of a vacancy in copper. Physica Status Solidi (a) 108:2, pages 509-517.
Crossref
J.M. Dominguez, O. Guzman & A. Garcia. 1988. Catalysis 1987, Proceedings of the 10th North American Meeting of the Catalysis Society. Catalysis 1987, Proceedings of the 10th North American Meeting of the Catalysis Society 567 576 .
C.B. Boothroyd & W.M. Stobbs. (1988) The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructures. Ultramicroscopy 26:4, pages 361-376.
Crossref
K. Watanabe, Y. Kikuchi & H. Yamaguchi. (1986) Screening Effect on Lattice Images of Silicon. physica status solidi (a) 98:2, pages 409-416.
Crossref
S. Amelinckx. 1986. Examining the Submicron World. Examining the Submicron World 71 132 .
H. Matsuhata, D. Van Dyck, J. Van Landuyt & S. Amelinckx. (1984) A practical approach to the periodic continuation method for the simulation of high resolution TEM images of isolated crystal defects. Ultramicroscopy 13:3, pages 343-347.
Crossref
J.M. Gibson. (1984) High resolution electron microscopy of interfaces between epitaxial thin films and semiconductors. Ultramicroscopy 14:1-2, pages 1-10.
Crossref
J. Van Landuyt, G. Van Tendeloo & S. Amelinckx. (1983) High resolution electron microscopy of polytypes. Progress in Crystal Growth and Characterization 7:1-4, pages 343-378.
Crossref
S. Iijima. (2020) Many-Beam Lattice Images from Thicker Crystals. Proceedings, annual meeting, Electron Microscopy Society of America 36:3, pages 130-139.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.