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Publication Cover
The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics
Series 8
Volume 36, 1977 - Issue 5
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Original Articles

Misfit dislocations in the epitaxial (111) Cu2O/(111) Cu system

J. H. Ho Department of Chemical Engineering and Materials Science, Syracuse University, Syracuse, New York, 13210, U.S.A.
&
R. W. Vook Department of Chemical Engineering and Materials Science, Syracuse University, Syracuse, New York, 13210, U.S.A.
Pages 1051-1062 | Received 15 Jun 1977, Published online: 27 Sep 2006

Citations (18)

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Read on this site (3)

S. Mellul & J.-P. Chevalier. (1991) Interfacial phase transitions and bonding in the Cu/Al2O3 system. Philosophical Magazine A 64:3, pages 561-576.
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R.H. Milne & A. Howie. (1984) Electron microscopy of copper oxidation. Philosophical Magazine A 49:5, pages 665-682.
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R. W. Vook. (1982) Structure and growth of thin films. International Metals Reviews 27:1, pages 209-245.
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Articles from other publishers (15)

Ruijin Hong, Jinxia Wang, Chunxian Tao & Dawei Zhang. (2017) Fabrication of single phase transparent conductive cuprous oxide thin films by direct current reactive magnetron sputtering. Fabrication of single phase transparent conductive cuprous oxide thin films by direct current reactive magnetron sputtering.
G.W. Zhou. (2009) TEM investigation of interfaces during cuprous island growth. Acta Materialia 57:15, pages 4432-4439.
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M. B. Vukmirovic, N. Vasiljevic, N. Dimitrov & K. Sieradzki. (2003) Diffusion-Limited Current Density of Oxygen Reduction on Copper. Journal of The Electrochemical Society 150:1, pages B10.
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G.P Kothiyal, K.P Muthe, J.C Vyas, D.P Gandhi, V.K Handu, K.D Singh, S.C Sabharwal & M.K Gupta. (1994) Electron spectroscopy for chemical analysis studies on electron beam evaporated CuOx thin films. Thin Solid Films 249:2, pages 140-143.
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Claude Esnouf & Daniel Treheux. 1991. Interfaces in New Materials. Interfaces in New Materials 170 179 .
Catherine Beraud & Claude Esnouf. (1990) Liaison cuivre-alumine : evolution et caractérisation microscopique des composés interfaciaux. Microscopy Microanalysis Microstructures 1:1, pages 69-90.
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C. Beraud, M. Courbiere, C. Esnouf, D. Juve & D. Treheux. (1989) Study of copper-alumina bonding. Journal of Materials Science 24:12, pages 4545-4554.
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P.B. Johnson, D.G.A. Nelson, T. Corfiatis, N.J. Long & R.W. Thomson. (1988) A TEM study of D+ -implanted Cu following Ar+-ion milling: Microstructure and epitaxial Cu2O formation. Journal of Nuclear Materials 160:2-3, pages 178-185.
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R. W. Vook. (2011) Thin Film Growth. MRS Proceedings 103.
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W. Krakow & V. Castano. (2011) Analysis of Oxide Surfaces by High Resolution Transmission Electron Microscopy. MRS Proceedings 83.
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P. M. Kluge-Weiss & C. L. Bauer. (1980) Characterization of [001] tilt boundaries in bicrystalline thin films of copper. Physica Status Solidi (a) 58:2, pages 333-341.
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R.W. Vook. (1979) Epitaxy and misfit dislocations in large misfit systems. Thin Solid Films 64:1, pages 91-102.
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D.J. Dingley & R.C. Pond. (1979) On the interaction of crystal dislocations with grain boundaries. Acta Metallurgica 27:4, pages 667-682.
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R.W. Vook & J.H. Ho. (1979) The annealing of misfit dislocations in the (111) Cu/(111) Cu2O system. Thin Solid Films 58:1, pages 153-158.
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J.H. Ho & R.W. Vook. (1978) (111)Cu2O growth modes on (111)Cu surfaces. Journal of Crystal Growth 44:5, pages 561-569.
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