Advanced search
Publication Cover
Communications in Statistics. Stochastic Models Volume 8, 1992 - Issue 2
Journal homepage
18
Views
9
CrossRef citations to date
0
Altmetric
Original Articles

Optimal policy for a general repair replacement model: discounted reward case

YEH LAM Department of Statistics, THE CHINESE UNIVERSITY OF HONG KONG, Shatin, N.T., Hong Kong
Pages 245-267 | Received 31 Aug 1990, Accepted 22 Dec 1991, Published online: 21 Mar 2007

Citations (9)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (1)

Yeh Lam & Yee Kit Tse. (2003) Optimal maintenance model for a multistate deteriorating system: a geometric process approach . International Journal of Systems Science 34:5, pages 303-308.
Read now

Articles from other publishers (8)

Yeh Lam. (2009) A Geometric Process $\delta$-Shock Maintenance Model. IEEE Transactions on Reliability 58:2, pages 389-396.
Crossref
Lam Yeh. (2016) A Monotone Process Maintenance Model for a Multistate System. Journal of Applied Probability 42:1, pages 1-14.
Crossref
Yeh Lam & Yuan Lin Zhang. (2004) A shock model for the maintenance problem of a repairable system. Computers & Operations Research 31:11, pages 1807-1820.
Crossref
Yeh Lam & Yuan Lin Zhang. (2003) A geometric-process maintenance model for a deteriorating system under a random environment. IEEE Transactions on Reliability 52:1, pages 83-89.
Crossref
Yeh Lam, Yuan Lin Zhang & Yao Hui Zheng. (2002) A geometric process equivalent model for a multistate degenerative system. European Journal of Operational Research 142:1, pages 21-29.
Crossref
Yeh Lam. (1999) An optimal maintenance model for a combination of secondhand–new or outdated–updated system. European Journal of Operational Research 119:3, pages 739-752.
Crossref
Yeh Lam. (1997) An optimal maintenance model using a number of different actions. Microelectronics Reliability 37:4, pages 615-622.
Crossref
Yeh Lam. (1997) A maintenance model for two-unit redundant system. Microelectronics Reliability 37:3, pages 497-504.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.