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Journal of Information Display Volume 14, 2013 - Issue 4
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Articles

Degradation behaviors of InGaN/GaN-based multiple quantum wells blue light-emitting diodes by chip size

Jae-Hyoung RyuKorea Institute of Lighting Technology, Jeonbuk Institute, Iksan, Republic of KoreaCorrespondence[email protected]
,
Jin Hwan LeeKorea Institute of Lighting Technology, Jeonbuk Institute, Iksan, Republic of Korea
,
Woo Young SunKorea Institute of Lighting Technology, Jeonbuk Institute, Iksan, Republic of Korea
&
Mee Ryoung ChoKorea Institute of Lighting Technology, Jeonbuk Institute, Iksan, Republic of Korea
Pages 131-135 | Received 31 Jul 2013, Accepted 01 Nov 2013, Published online: 28 Nov 2013

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