Citations (19)
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Mou-Yuan Liao. (2016) Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities. International Journal of Production Research 54:24, pages 7491-7503.
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Mou-Yuan Liao. (2016) Process capability control chart for non-normal data – evidence of on-going capability assessment. Quality Technology & Quantitative Management 13:2, pages 165-181.
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Malin Albing & Kerstin Vännman. (2011) Elliptical safety region plots for C
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Articles from other publishers (16)
Mou-Yuan Liao & WL Pearn. (2018) Modified weighted standard deviation index for adequately interpreting a supplier’s lognormal process capability. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 233:3, pages 999-1008.
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Michele Scagliarini. (2018)
A sequential hypothesis testing procedure for the process capability index
C
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Mou-Yuan Liao & Hsiao-Chi Ling. (2018) Effective Control Chart for Monitoring the Capability Stability of Non-Normal Processes Having S-Type Quality. Journal of Testing and Evaluation 46:3, pages 20160566.
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Mou-Yuan Liao. (2017) Efficient Technique for Assessing Actual Non-normal Quality Loss: Markov Chain Monte Carlo. Quality and Reliability Engineering International 33:5, pages 945-957.
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Chien-Wei WuMou-Yuan Liao, Chi-Wei LinTzu-Ling Lin. (2016) Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data. Journal of Testing and Evaluation 44:5, pages 20150262.
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Antonio Lepore & Biagio Palumbo. (2015) New Insights into the Decisional Use of Process Capability Indices via Hypothesis Testing. Quality and Reliability Engineering International 31:8, pages 1725-1741.
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Ya-Chen Hsu, Amber JaneW. L. Pearn. (2015) Tool Replacement for Photovoltaic Industry Processes With Multiple Characteristics Based on Capability Index. Journal of Testing and Evaluation 43:5, pages 20130219.
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Moutushi Chatterjee & Ashis Kumar Chakraborty. (2014)
Exact Relationship of
C
″
pk
with Proportion of Nonconformance and Some Other Properties of
C
″
p
(
u
,
v
)
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Kerstin Vännman. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Ya-Chen HsuW. L. PearnYa-Fei Chuang. (2012) Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer. Journal of Testing and Evaluation 40:6, pages 104598.
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M. R. Mitchell, R. E. Link, Chien-Wei Wu, Mou-Yuan Liao & Ming-Hung Shu. (2010) Process Performance Evaluation with Imprecise Information. Journal of Testing and Evaluation 38:2, pages 102480.
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W.L. Pearn, H.Y. Kang, A.H.-I. Lee & M.Y. Liao. (2009) Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics. IEEE Transactions on Semiconductor Manufacturing 22:3, pages 351-356.
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Ya-Chen Hsu, W.L. Pearn & Ya-Fei Chuang. (2009) Sample size determination for production yield estimation with multiple independent process characteristics. European Journal of Operational Research 196:3, pages 968-978.
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P. Castagliola & K. Vännman. (2008) Average run length when monitoring capability indices using EWMA. Quality and Reliability Engineering International 24:8, pages 941-955.
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Kerstin Vännman. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Philippe Castagliola & Kerstin Vannman. (2007) The efficiency of the EWMA capability chart. The efficiency of the EWMA capability chart.