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Quality Technology & Quantitative Management Volume 4, 2007 - Issue 4
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Original Articles

Process Capability Plots for One-Sided Specification Limits

Kerstin VännmanDepartment of Mathematics, Luleå University of Technology, SwedenView further author information
&
Malin AlbingDepartment of Mathematics, Luleå University of Technology, SwedenView further author information
Pages 569-590 | Received 01 Dec 2005, Accepted 01 May 2007, Published online: 09 Feb 2016

Citations (13)

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Read on this site (5)

Moutushi Chatterjee & Ashis Kumar Chakraborty. (2016) Some process capability indices for unilateral specification limits—Their properties and the process capability control charts. Communications in Statistics - Theory and Methods 45:24, pages 7130-7160.
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Mou-Yuan Liao. (2016) Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities. International Journal of Production Research 54:24, pages 7491-7503.
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Nani Kurniati, Ruey-Huei Yeh & Chien-Wei Wu. (2015) Designing a variables two-plan sampling system of type TNTVSS-(nT, nN; k) for controlling process fraction nonconforming with unilateral specification limit. International Journal of Production Research 53:7, pages 2011-2025.
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Malin Albing & Kerstin Vännman. (2011) Elliptical safety region plots for C . Journal of Applied Statistics 38:6, pages 1169-1187.
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Malin Albing & Kerstin Vännman. (2009) Skewed zero-bound distributions and process capability indices for upper specifications. Journal of Applied Statistics 36:2, pages 205-221.
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Articles from other publishers (8)

M.-Y. Liao, C.-W. Wu & S.-H. Wen. (2017) Assessing S-Type Process Quality of Data Involving Batch-to-Batch Variation. Journal of Testing and Evaluation 45:4, pages 20150375.
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Mou-Yuan Liao. (2017) Efficient Technique for Assessing Actual Non-normal Quality Loss: Markov Chain Monte Carlo. Quality and Reliability Engineering International 33:5, pages 945-957.
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Chien-Wei WuMou-Yuan Liao, Chi-Wei LinTzu-Ling Lin. (2016) Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data. Journal of Testing and Evaluation 44:5, pages 20150262.
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Ya-Chen Hsu, Amber JaneW. L. Pearn. (2015) Tool Replacement for Photovoltaic Industry Processes With Multiple Characteristics Based on Capability Index. Journal of Testing and Evaluation 43:5, pages 20130219.
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Vahab Moradi & Bahram Sadeghpour Gildeh. (2012) Fuzzy process capability plots for families of one-sided specification limits. The International Journal of Advanced Manufacturing Technology 64:1-4, pages 357-367.
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Ya-Chen HsuW. L. PearnYa-Fei Chuang. (2012) Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer. Journal of Testing and Evaluation 40:6, pages 104598.
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MOUTUSHI CHATTERJEE & ASHIS KUMAR CHAKRABORTY. (2012) UNIVARIATE PROCESS CAPABILITY INDICES FOR UNILATERAL SPECIFICATION REGION — A REVIEW AND SOME MODIFICATIONS. International Journal of Reliability, Quality and Safety Engineering 19:04, pages 1250020.
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Ya-Chen Hsu, W.L. Pearn & Ya-Fei Chuang. (2009) Sample size determination for production yield estimation with multiple independent process characteristics. European Journal of Operational Research 196:3, pages 968-978.
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