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Original Articles

Parametric Degradation Model with Multiple Competing Risks

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Pages 389-400 | Received 01 Nov 2009, Accepted 01 Oct 2010, Published online: 09 Feb 2016

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Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Víctor Hugo Flores-Ochoa, Iván JC Pérez Olguín & Vicente García. (2023) Degradation modeling based on the gamma process with random initial degradation level and random threshold. Quality Technology & Quantitative Management 20:6, pages 730-750.
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Luis A. Rodríguez-Picón, Manuel I. Rodríguez Borbón, Delia J. Valles-Rosales & Víctor H. Flores Ochoa. (2016) Modelling degradation with multiple accelerated processes. Quality Technology & Quantitative Management 13:3, pages 333-354.
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