Two-sided tolerance intervals for members of the (log)-location-scale family of distributions

Miao YuanDepartment of Statistics, Virginia Tech, Blacksburg, VA, USA.

Yili HongDepartment of Statistics, Virginia Tech, Blacksburg, VA, USA.Correspondence[email protected]

Luis A. EscobarDepartment of Experimental Statistics, Louisiana State University, Baton Rouge, LA, USA.

William Q. MeekerDepartment of Statistics, Iowa State University, Ames, IA, USA.

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N. Balakrishnan & E. Castilla. (2023) Robust estimation based on one-shot device test data under log-normal lifetimes. Statistics 0:0, pages 1-26.
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Guodong Wang, Li Shao, Honggen Chen, Qingan Cui & Shanshan Lv. (2019) Calculating confidence intervals for percentiles of accelerated life tests with subsampling. Quality Technology & Quantitative Management 16:4, pages 424-438.
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