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Critical Reviews in Solid State and Materials Sciences Volume 28, 2003 - Issue 4
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Original Articles

High-κ Dielectric Materials for Microelectronics

Robert M. Wallace Departments of Electrical Engineering and Physics, P.O. Box 830688, EC33, University of Texas at Dallas, Richardson, Texas 75083
&
Glen D. Wilk ASM America, 3440 E. University Drive, Phoenix, Arizona 85034
Pages 231-285 | Published online: 24 Jun 2010

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Amit Singh & Sanjai Singh. (2021) Effect of annealing temperature on electrical properties of Al/ZrO2/p-Si MOS capacitor. Ferroelectrics Letters Section 48:1-3, pages 40-45.
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N. Izyumskaya, Ya. Alivov & H. Morkoç. (2009) Oxides, Oxides, and More Oxides: High-κ Oxides, Ferroelectrics, Ferromagnetics, and Multiferroics. Critical Reviews in Solid State and Materials Sciences 34:3-4, pages 89-179.
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Articles from other publishers (173)

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