150
Views
35
CrossRef citations to date
0
Altmetric
Articles

Analysis of atomic force microscope pull-off forces for gold surfaces portraying nanoscale roughness and specific chemical functionality

Pages 1-17 | Published online: 02 Apr 2012

Keep up to date with the latest research on this topic with citation updates for this article.

Read on this site (8)

D. Caballero, M. Pla‐Roca, F. Bessueille, C. A. Mills, J. Samitier & A. Errachid. (2006) Atomic Force Microscopy Characterization of a Microcontact Printed, Self‐Assembled Thiol Monolayer for Use in Biosensors. Analytical Letters 39:8, pages 1721-1734.
Read now
Olivier Noel, Houssein Awada, Gilles Castelein, Maurice Brogly & Jacques Schultz. (2006) Force Curve Measurements with the AFM: Application to the In Situ Determination of Grafted Silicon-Wafer Surface Energies. The Journal of Adhesion 82:7, pages 649-669.
Read now
DmitriV. Vezenov, Aleksandr Noy & Paul Ashby. (2005) Chemical force microscopy: probing chemical origin of interfacial forces and adhesion. Journal of Adhesion Science and Technology 19:3-5, pages 313-364.
Read now
D. S. Grierson, E. E. Flater & R. W. Carpick. (2005) Accounting for the JKR–DMT transition in adhesion and friction measurements with atomic force microscopy. Journal of Adhesion Science and Technology 19:3-5, pages 291-311.
Read now
F. L. Leite & P. S. P. Herrmann. (2005) Application of atomic force spectroscopy (AFS) to studies of adhesion phenomena: a review. Journal of Adhesion Science and Technology 19:3-5, pages 365-405.
Read now
GarthW. Tormoen, Jaroslaw Drelich & Jakub Nalaskowski. (2005) A distribution of AFM pull-off forces for glass microspheres on a symmetrically structured rough surface. Journal of Adhesion Science and Technology 19:3-5, pages 215-234.
Read now

Articles from other publishers (27)

Florian Copt, Yoan Civet, Christian Koechli & Yves Perriard. (2021) Design and manufacturing of an electrostatic MEMS relay for high power applications. Sensors and Actuators A: Physical 321, pages 112569.
Crossref
Michael Lee, Rahul Kumar Raghava Reddi, Junbin Choi, Jian Liu, Xiaosong Huang, Hanna Cho & Jung-Hyun Kim. (2020) In-Operando AFM Characterization of Mechanical Property Evolution of Si Anode Binders in Liquid Electrolyte. ACS Applied Energy Materials 3:2, pages 1899-1907.
Crossref
Ali Habibi & Hassan Dehghanpour. (2018) Wetting Behavior of Tight Rocks: From Core Scale to Pore Scale. Water Resources Research 54:11, pages 9162-9186.
Crossref
Corina Birleanu & Marius Pustan. (2015) Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope. Analog Integrated Circuits and Signal Processing 82:3, pages 571-581.
Crossref
Corina Birleanu & Marius Pustan. (2014) Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope. Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope.
Siming You & Man Pun Wan. (2013) Mathematical Models for the van der Waals Force and Capillary Force between a Rough Particle and Surface. Langmuir 29:29, pages 9104-9117.
Crossref
David S. Grierson, Jingjing Liu, Robert W. Carpick & Kevin T. Turner. (2013) Adhesion of nanoscale asperities with power-law profiles. Journal of the Mechanics and Physics of Solids 61:2, pages 597-610.
Crossref
Volodymyr Kuznetsov & Georg Papastavrou. (2012) Adhesion of Colloidal Particles on Modified Electrodes. Langmuir 28:48, pages 16567-16579.
Crossref
Ruairidh G. Couston, Dimitrios A. Lamprou, Shahid Uddin & Christopher F. van der Walle. (2012) Interaction and destabilization of a monoclonal antibody and albumin to surfaces of varying functionality and hydrophobicity. International Journal of Pharmaceutics 438:1-2, pages 71-80.
Crossref
Fabio L. Leite, Carolina C. Bueno, Alessandra L. Da Róz, Ervino C. Ziemath & Osvaldo N. OliveiraJr.Jr.. (2012) Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy. International Journal of Molecular Sciences 13:12, pages 12773-12856.
Crossref
G. Jóźwiak, A. Henrykowski, A. Masalska & T. Gotszalk. (2012) Regularization mechanism in blind tip reconstruction procedure. Ultramicroscopy 118, pages 1-10.
Crossref
Frank M. Etzler & Jaroslaw Drelich. 2012. Developments in Surface Contamination and Cleaning. Developments in Surface Contamination and Cleaning 307 331 .
Alan Barros de Oliveira, Andrea Fortini, Sergey V. Buldyrev & David Srolovitz. (2011) Dynamics of the contact between a ruthenium surface with a single nanoasperity and a flat ruthenium surface: Molecular dynamics simulations. Physical Review B 83:13.
Crossref
Ryan L. Jones, Bronwyn L. Harrod & James D. Batteas. (2010) Intercalation of 3-Phenyl-1-proponal into OTS SAMs on Silica Nanoasperities to Create Self-Repairing Interfaces for MEMS Lubrication. Langmuir 26:21, pages 16355-16361.
Crossref
Dimitrios A. Lamprou, James R. Smith, Thomas G. Nevell, Eugen Barbu, Corinne Stone, Colin R. Willis & John Tsibouklis. (2010) A comparative study of surface energy data from atomic force microscopy and from contact angle goniometry. Applied Surface Science 256:16, pages 5082-5087.
Crossref
Philippe Begat, David A.V Morton, Jagdeep Shur, Paul Kippax, John N Staniforth & Robert Price. (2009) The Role of Force Control Agents in High-Dose Dry Powder Inhaler Formulations. Journal of Pharmaceutical Sciences 98:8, pages 2770-2783.
Crossref
Andrea Fortini, Mikhail I. Mendelev, Sergey Buldyrev & David Srolovitz. (2008) Asperity contacts at the nanoscale: Comparison of Ru and Au. Journal of Applied Physics 104:7.
Crossref
Chang Xu, Ryan L. Jones & James D. Batteas. (2008) Dynamic Variations in Adhesion of Self-Assembled Monolayers on Nanoasperities Probed by Atomic Force Microscopy. Scanning 30:2, pages 106-117.
Crossref
Craig D. Blanchette, Albert Loui & Timothy V. Ratto. 2008. Handbook of Molecular Force Spectroscopy. Handbook of Molecular Force Spectroscopy 185 203 .
Aleksandr Noy, Dmitry V. Vezenov & Charles M. Lieber. 2008. Handbook of Molecular Force Spectroscopy. Handbook of Molecular Force Spectroscopy 97 122 .
Seong H. Kim, David B. Asay & Michael T. Dugger. (2007) Nanotribology and MEMS. Nano Today 2:5, pages 22-29.
Crossref
J. Drelich. (2006) Adhesion forces measured between particles and substrates with nano-roughness. Mining, Metallurgy & Exploration 23:4, pages 226-232.
Crossref
Gerd Habenicht. 2006. Kleben. Kleben 863 1024 .
Hans-Jürgen Butt, Brunero Cappella & Michael Kappl. (2005) Force measurements with the atomic force microscope: Technique, interpretation and applications. Surface Science Reports 59:1-6, pages 1-152.
Crossref
Jaroslaw Drelich & Dorota Chibowska. (2005) Spreading Kinetics of Water Drops on Self-Assembled Monolayers of Thiols:  Significance of Inertial Effects. Langmuir 21:17, pages 7733-7738.
Crossref
Han-Cheol Kwon & Andrew A. Gewirth. (2005) AFM Force Measurements between SAM-Modified Tip and SAM-Modified Substrate in Alkaline Solution. The Journal of Physical Chemistry B 109:20, pages 10213-10222.
Crossref
Jaroslaw Drelich, Garth W. Tormoen & Elvin R. Beach. (2004) Determination of solid surface tension from particle–substrate pull-off forces measured with the atomic force microscope. Journal of Colloid and Interface Science 280:2, pages 484-497.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.