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Zhen Li, Arthur Haigh, Constantinos Soutis, Andrew Gibson & Ping Wang. (2019) A review of microwave testing of glass fibre-reinforced polymer composites. Nondestructive Testing and Evaluation 34:4, pages 429-458.
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MiloW. Hyde, MichaelJ. Havrilla, AndrewE. Bogle, EdwardJ. Rothwell & GaryD. Dester. (2012) An Improved Two-Layer Method for Nondestructively Characterizing Magnetic Sheet Materials Using a Single Rectangular Waveguide Probe. Electromagnetics 32:7, pages 411-425.
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G. D. Dester &
E. J. Rothwell. (2008) Natural Resonances of a Lossy Conductor-backed SLAB Excited by a Non-planar Incident Field. Journal of Electromagnetic Waves and Applications 22:8-9, pages 1081-1098.
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Articles from other publishers (23)
Anil Kumar Yerrola, Suraj Sharma, Maifuz Ali, Ravi Kumar Arya & Lakhindar Murmu. 2022. Topical Drifts in Intelligent Computing. Topical Drifts in Intelligent Computing
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Petr Kadlec, Martin Stumpf & Tomas Dolezal. (2021) Reconstructing the Material Properties of a Scalar Metasurface - A Stochastic Optimization Approach. Reconstructing the Material Properties of a Scalar Metasurface - A Stochastic Optimization Approach.
Neil Rogers, Michael Havrilla, Milo W. Hyde & Alexander Knisely. (2020) Nondestructive Electromagnetic Characterization of Uniaxial Sheet Media Using a Two-Flanged Rectangular Waveguide Probe. IEEE Transactions on Instrumentation and Measurement 69:6, pages 2938-2947.
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Adam L. Brooks & Michael J. Havrilla. (2019) Reduced Aperture Flanged Rectangular Waveguide Probe for Measurement of Conductor Backed Uniaxial Materials. Reduced Aperture Flanged Rectangular Waveguide Probe for Measurement of Conductor Backed Uniaxial Materials.
Zhen Li, Arthur Haigh, Constantinos Soutis, Andrew Gibson & Robin Sloan. (2018) A Simulation-Assisted Non-destructive Approach for Permittivity Measurement Using an Open-Ended Microwave Waveguide. Journal of Nondestructive Evaluation 37:3.
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Alexander G. Knisely, Milo W. Hyde, Michael J. Havrilla & Peter J. Collins. (2016) Uniaxial anisotropic material measurement using a single port waveguide probe. Uniaxial anisotropic material measurement using a single port waveguide probe.
Milo W. Hyde & Michael J. Havrilla. (2016) A Broadband, Nondestructive Microwave Sensor for Characterizing Magnetic Sheet Materials. IEEE Sensors Journal 16:12, pages 4740-4748.
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Milo W. Hyde & Michael J. Havrilla. (2016) Multimode analysis of a one-port dual ridged waveguide probe. Multimode analysis of a one-port dual ridged waveguide probe.
Milo W. Hyde IV, Michael J. Havrilla & Andrew E. Bogle. (2016) Nondestructive Determination of the Permittivity Tensor of a Uniaxial Material Using a Two-Port Clamped Coaxial Probe. IEEE Transactions on Microwave Theory and Techniques 64:1, pages 239-246.
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Milo W. HydeIVIV & Michael J. Havrilla. (2015) Broadband, non‐destructive characterisation of PEC‐backed materials using a dual‐ridged‐waveguide probe. IET Science, Measurement & Technology 9:1, pages 56-62.
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Milo W. HydeIVIV, Andrew E. Bogle & Michael J. Havrilla. (2014) Nondestructive characterization of Salisbury screen and Jaumann absorbers using a clamped rectangular waveguide geometry. Measurement 53, pages 83-90.
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Abdulkadhum A. Hassan. (2014) Multilayer medium technique for nondestructive EM-properties measurement of radar absorbing materials using flanged rectangular waveguide sensor and FDTD method. Multilayer medium technique for nondestructive EM-properties measurement of radar absorbing materials using flanged rectangular waveguide sensor and FDTD method.
M. W. HydeIVIV & M. J. Havrilla. (2013) A clamped dual-ridged waveguide measurement system for the broadband, nondestructive characterization of sheet materials. Radio Science 48:5, pages 628-637.
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Gary D. Dester, Edward J. Rothwell & Michael J. Havrilla. (2012) Two-Iris Method for the Electromagnetic Characterization of Conductor-Backed Absorbing Materials Using an Open-Ended Waveguide Probe. IEEE Transactions on Instrumentation and Measurement 61:4, pages 1037-1044.
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Milo W. Hyde, Michael J. Havrilla, Andrew E. Bogle & Edward J. Rothwell. (2012) Nondestructive Material Characterization of a Free-Space-Backed Magnetic Material Using a Dual-Waveguide Probe. IEEE Transactions on Antennas and Propagation 60:2, pages 1009-1019.
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M. J. Havrilla, A. E. Bogle, M. W. Hyde & E. J. Rothwell. (2011) Electromagnetic material characterization of conductor- backed media using a NDE microstrip probe. Electromagnetic material characterization of conductor- backed media using a NDE microstrip probe.
M W Hyde, M J Havrilla & A E Bogle. (2011) A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry*. Measurement Science and Technology 22:8, pages 085704.
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Gary D. Dester, Edward J. Rothwell & Michael J. Havrilla. (2010) An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy. IEEE Microwave and Wireless Components Letters 20:5, pages 298-300.
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M. J. Havrilla & M. W. Hyde. (2009) Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error. Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error.
Milo W. HydeIVIV, James W. Stewart, Michael J. Havrilla, William P. Baker, Edward J. Rothwell & Dennis P. Nyquist. (2009) Nondestructive electromagnetic material characterization using a dual waveguide probe: A full wave solution. Radio Science 44:3, pages n/a-n/a.
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G.D. Dester & E.J. Rothwell. (2008) Sensitivity analysis of the two-thickness and two-layer methods for material parameter extraction using a single waveguide probe. Sensitivity analysis of the two-thickness and two-layer methods for material parameter extraction using a single waveguide probe.
Milo Wilt Hyde IV & Michael J. Havrilla. (2008) A NONDESTRUCTIVE TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY AND PERMEABILITY OF MAGNETIC SHEET MATERIALS USING TWO FLANGED RECTANGULAR WAVEGUIDES. Progress In Electromagnetics Research 79, pages 367-386.
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Zhi-Xi Chen, Xi-Wang Dai & Chang-Hong Liang. (2007) NOVEL DUAL-MODE DUAL-BAND BANDPASS FILTER USING DOUBLE SQUARE-LOOP STRUCTURE. Progress In Electromagnetics Research 77, pages 409-416.
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