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Materials Science and Technology Volume 21, 2005 - Issue 11
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Articles

Distribution of misorientations and grain boundary planes in grain boundary engineered brass

V. Randle
,
Y. Hu
,
G. S. Rohrer
&
C.-S. Kim
Pages 1287-1292 | Published online: 19 Jul 2013

Citations (9)

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Y. B. Zhang, A. Godfrey, W. Liu & Q. Liu. (2010) Investigation of boundary migration during grain growth in fully recrystallised high purity nickel. Materials Science and Technology 26:2, pages 197-202.
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Articles from other publishers (8)

Jieke Zhang, Yu Cao, Yuhao Gong, Jun Xiao, Yulong Zhu, Rui Luo, Qubo He & Qing Liu. (2023) Revealing hot deformation behavior of inconel X-750 superalloy: A novel hot processing map coupled with grain boundary engineering. Journal of Materials Research and Technology 25, pages 1245-1262.
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Vivek Devulapalli, Marcus Hans, Prithiv T. Sukumar, Jochen M. Schneider, Gerhard Dehm & C.H. Liebscher. (2022) Microstructure, grain boundary evolution and anisotropic Fe segregation in (0001) textured Ti thin films. Acta Materialia 238, pages 118180.
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Sutatch Ratanaphan, Dierk Raabe, Rajchawit Sarochawikasit, David L. Olmsted, Gregory S. Rohrer & K. N. Tu. (2016) Grain boundary character distribution in electroplated nanotwinned copper. Journal of Materials Science 52:7, pages 4070-4085.
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Anthony D. Rollett & Katayun Barmak. 2014. Physical Metallurgy. Physical Metallurgy 1113 1141 .
Gregory S. Rohrer. (2011) Measuring and Interpreting the Structure of Grain‐Boundary Networks. Journal of the American Ceramic Society 94:3, pages 633-646.
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Michael A. Groeber. 2011. Computational Methods for Microstructure-Property Relationships. Computational Methods for Microstructure-Property Relationships 53 97 .
Michael A. Groeber, David J. Rowenhorst & Michael D. Uchic. 2009. Electron Backscatter Diffraction in Materials Science. Electron Backscatter Diffraction in Materials Science 123 137 .
Vivek Devulapalli, Marcus Hans, Prithiv T. Sukumar, Jochen M. Schneider, Gerhard Dehm & Christian H. Liebscher. (2021) Microstructure, Grain Boundary Evolution and Anisotropic Fe Segregation in (0001) Textured Ti Thin films. SSRN Electronic Journal.
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