ABSTRACT
Full-wave electromagnetic (EM) analysis is a versatile tool for evaluating the performance of high-frequency components. Its potential drawback is its high computational cost, inhibiting the execution of EM-driven tasks requiring massive simulations. The applicability of equivalent network models is limited owing to the topological complexity of compact microstrip components because of EM cross-coupling effects. Development of alternative representations (surrogate models) is therefore necessary. This article proposes a two-level methodology for reliable modelling of compact microstrip components. The keystone is to define the surrogate domain using the first-level model approximating the set of pre-existing reference designs. This limits the volume of the parameter space region that needs to be sampled when constructing the second-level model. The presented approach provides far greater accuracy than conventional methods and is capable of establishing surrogates covering wide ranges of geometric parameters and operating conditions of a particular structure. Applications for parametric optimization are also provided.
Acknowledgement
The authors would like to thank Dassault Systèmes, France, for making CST Studio Suite available.
Disclosure statement
No potential conflict of interest was reported by the authors.
ORCID
Slawomir Koziel http://orcid.org/0000-0002-9063-2647
Anna Pietrenko-Dabrowska http://orcid.org/0000-0003-2319-6782