Analysis of process yield in a cost-effective double acceptance sampling plan

Abstract

In this manuscript, we have developed an enhanced second stage structure of variable double acceptance sampling (DAS) plan to increase its efficiency and decrease the expected cost of inspection. Measured quality characteristics based on the two independent random samples are not intermixed in our proposed second stage. We have analyzed process yield index for linear profiles for two-sided specifications as a gauge for a scientific decision. Desirable quality levels and tolerable risks are used to optimize the plan parameters. The proposed DAS plan requires smaller expected sample sizes to be inspected and its performance is evaluated through operating characteristic function. A practical example is provided to demonstrate the proposed plan.

Keywords:

• Double acceptance sampling plan
• process yield index
• two-sided specifications
• multiple linear profiles

Acknowledgments

The authors are deeply thankful to editor and reviewers for their valuable suggestions to improve the quality of this manuscript. This article was funded by the Deanship of Scientific Research (DSR), King Abdulaziz University, Jeddah. The author, Muhammad Aslam, therefore, acknowledge with thanks DSR technical and financial support.