Abstract
An improved model based on the electromagnetic topology (EMT) theory and Baum-Liu-Tesche (BLT) equation is presented to evaluate the shielding performance of an apertured enclosure. First, the total aperture impedance of arbitrarily positioned apertures can be easily obtained through the coupling factor. Then, the expression of the electric field components at any monitor point inside the enclosure is derived according to the relation between voltage response and field distribution, hence, the shielding effectiveness (SE) and resonances can be analyzed conveniently. Finally, the improved model is validated by the CST, showing high efficiency and accuracy for the prediction of the SE and resonant modes of an enclosure. The improved model is suitable for handling slots that have a large length-width ratio, irregularly arranged aperture arrays, multiple apertures with different shapes and dimensions, and cascaded triple enclosures with off-centered apertures, showing the wide application range of this model.
Disclosure statement
No potential conflict of interest was reported by the author(s).
Additional information
Funding
Notes on contributors
Jian Sun
Jian Sun was born in Liaoning, China, in 1986. He received a PhD degree in communication and information systems from Beijing Jiaotong University, Beijing, China, in 2019, where he is currently a Lecturer with the School of Information and Communication Engineering, Beijing Information Science and Technology University. His main research interests include all optical signal processing and Supercontinuum.
Yanfei Gong
Yanfei Gong was born in Shandong, China, in 1987. He received a PhD degree in electrical engineering from North China Electric Power University, Beijing, China, in 2019, where he is currently a Lecturer with the School of Information and Communication Engineering, Beijing Information Science and Technology University. His main research interests include electromagnetic pulse (EMP) interaction with transmission lines and electromagnetic shielding.
Luhang Jiang
Luhang Jiang was born in Jilin, China, in 1991. She received a BS degree in electrical engineering and automation from Hunan University, Changsha, China, in 2014. She received a PhD degree in electrical engineering from North China Electric Power University, Beijing, China, in 2020. Her main research interests include electromagnetic simulation and EMC/EMI in shielding enclosures.