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Articles

A Novel System for Yarn Cross-Section Analysis Based on Dual Orthogonal CCD Sensors

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Pages 114-125 | Published online: 04 Dec 2017
 

ABSTRACT

As a basis for yarn evenness measurement, a novel method based on two orthogonal charge-coupled device (CCD) sensors has been devised. We present a system for analyzing yarn evenness from the coefficient of variation of yarn perimeter, treating the yarn cross-sectional shape like an ellipse with uneven edges. The system architecture, algorithm flow, mathematical principle, and the experimental validation of the proposed technique are presented. A comparison between the proposed method and the conventional Uster Tester 5 and Lawson-Hemphill was made. Results agree quite well with existing methods hence can be implemented as an alternative technique for yarn evenness quantification.

摘要:

基于当前纱线条干均匀度的测试需求,提出了一种基于双轴向正交电荷耦合器件(CCD)传感器的全新纱线均匀度测量系统,该系统建立在对具有近似椭圆形不规则截面的纱线条干测量方法基础之上。文中对该系统的整体架构、原理、算法进行了阐释,并与传统的乌斯特 Tester 5和Lawson Hemphill等相关传统纱线条干均匀度测试仪器进行了对比验证。结果表明,该系统与现有方法吻合度较好,是对现有为纱线匀度测量系统的有益补充。

Funding

This work was supported by the Key Grant Project of Ministry of Education of the People’s Republic of China (Grant 113027A) and Donghua University Doctoral Innovation Fund (CUSF-DH-D-2015014).

Additional information

Funding

This work was supported by the Key Grant Project of Ministry of Education of the People’s Republic of China (Grant 113027A) and Donghua University Doctoral Innovation Fund (CUSF-DH-D-2015014).

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