156
Views
10
CrossRef citations to date
0
Altmetric
SECTION B: DIELECTRIC AND MICROWAVE PROPERTIES

Investigation of Top/Bottom Electrode and Diffusion Barrier Layer for PZT Thick Film MEMS Sensors

, , , &
Pages 201-213 | Received 27 Aug 2007, Published online: 20 Sep 2010
 

Abstract

Top and bottom electrodes for screen printed piezoelectric lead zirconate titanate, Pb(Zr x Ti1 − x )O3 (PZT) thick film are investigated with respect to future MEMS devices. Down to 100 nm thick E-beam evaporated Al and Pt films are patterned as top electrodes on the PZT using a lift-off process with a line width down to 3 μ m. A 700 nm thick ZrO2 layer as insolating diffusion barrier layer is found to be insufficient as barrier layer for PZT on a silicon substrate sintered at 850°C. EDX shows diffusion of Si into the PZT layer.

Acknowledgment

This work is a result of the PiMEMS project which is a collaboration between MIC, InSensor A/S and Ferroperm Piezoceramics A/S and is supported by “The Danish National Advanced Technology Foundation.”

Log in via your institution

Log in to Taylor & Francis Online

PDF download + Online access

  • 48 hours access to article PDF & online version
  • Article PDF can be downloaded
  • Article PDF can be printed
USD 61.00 Add to cart

Issue Purchase

  • 30 days online access to complete issue
  • Article PDFs can be downloaded
  • Article PDFs can be printed
USD 2,630.00 Add to cart

* Local tax will be added as applicable

Related Research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.