Abstract
Bismuth-based layer-structured Bi5Fe0.5Co0.5Ti3O15(BFCT) thin films have been deposited on Pt/Ti/SiO2/Si substrates by chemical solution deposition method. Using different heating rates during crystallization, we obtained randomly oriented and highly c-axis-oriented BFCT films. Anisotropic ferroelectricity were determined with the remnant polarization (2P r) ∼ 45.8 μC/cm2 for randomly oriented film and 2P r∼ 25.3 μC/cm2 for highly c-axis-oriented ones. Meanwhile, highly c-axis-oriented BFCT film shows better fatigue endurance than that of random orientation. Both above can confirm the ferroelectric anisotropy. Furthermore, magnetic anisotropy also has been observed and possible reasons were discussed.