Structural characterization of PZT and CFO/PZT films on (001) SrTiO₃ by the pulsed laser deposition (PLD)

Abstract

In this work, we investigated the structural properties of ferroelectric PbZr_0.2Ti_0.8O₃ (PZT) and ferrimagnetic/ferroelectric [CoFe₂O₄(CFO)/PZT] bilayers grown on (001)SrTiO₃ (STO) substrates with 50 nm thick LaNiO₃ bottom electrodes via X-ray diffraction by θ-2θ scan, reciprocal space mapping (RSM), rocking curve, and phi-scan modes. Interestingly, structural properties of the PZT layer exhibited remarkable changes after the top-layer CFO deposition. Both the c- and a-domains exist in the PZT layer by the data acquired and the tetragonality of the PZT decreases after the CFO top-layer deposition.

Keywords:

• Ferroelectric/ferrimagnetic bilayered structures
• PZT and CFO/PZT films
• structural characterization
• pulsed laser deposition

Additional information

Funding

This work was supported by the Special Funds for Major State Basic Research of China under Project No. 2013CB922302, the National Research Foundation of Korea (NRF-2012R1A1A2039113), the Startup Project of Donghua University by the FCT(SFRH/BPD/66959/2009), the Natural Science Foundation of China (61674058), and the fund of PLA-GA Dept. “The 13th Five-year” Pre-research Field Fundation “Basic application technology of graphene materials in batteries”(6140721040412).