Variable stage-independent double sampling plan with screening for acceptance quality loss limit inspection scheme

Abstract

The quality loss suggested by Taguchi has been recognised as a new quality evaluation based on variable property instead of the quality evaluation based on traditional attribute property such as the proportion of nonconforming items. Some variable sampling inspection plans in order to assure the quality have been considered. As one of those sampling inspection plans, the single sampling plan with screening (SSPS) has been constructed for acceptance quality loss limit inspection scheme. Further, the repetitive group sampling plan with screening (RGSPS) has been developed for reducing the average total inspection (ATI). Although ATI by RGSPS has successfully been reduced in comparison with ATI by SSPS, RGSPS may sometimes increase the average sampling frequency (ASF) in return for reducing ATI. In this study, the stage-independent double sampling plan with screening (SIDSPS) based on the concept of the acceptance quality loss limit inspection scheme is proposed under the consideration of the trade-off between ATI and ASF. Through some numerical comparisons about ATI and ASF in SSPS, RGSPS, and SIDSPS, the usefulness of SIDSPS proposed in this study is confirmed.

Keywords:

• acceptance quality loss limit inspection scheme
• average total inspection
• Patnaik's approximation
• quality loss
• stage-independent double sampling

Acknowledgments

We would like to appreciate the grant for our research.

Disclosure statement

No potential conflict of interest was reported by the authors.

Additional information

Funding

This work was supported by Japan Society for the Promotion of Science (JSPS) KAKENHI Grant Number 18K04611: ‘Evaluation of system performance and reliability under incomplete information environment’.