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Article

Estimation of uncertainty in lead spallation particle multiplicity and its propagation to a neutron energy spectrum

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Pages 276-290 | Received 12 Jul 2019, Accepted 17 Sep 2019, Published online: 10 Oct 2019

Figures & data

Figure 1. Comparison of DDX for p(800 MeV) +  natPb reaction between the PHITS calculations and experimental data

Figure 1. Comparison of DDX for p(800 MeV) +  natPb reaction between the PHITS calculations and experimental data

Figure 2. Histograms of relative difference from the PHITS calculation of DDXs for 20, 34, 48, 62.9, 63, 78, 113, 256, 597, and 800 MeV, as well as 1.0, 1.2, 1.5, 1.6, and 3.0 GeV p +  nat/208Pb reactions, where the values in each bin are normalized such that the integral value is unity. In each panel, the datapoint with the error bar indicates qM and uncertainty width  vx+ux of the distribution

Figure 2. Histograms of relative difference from the PHITS calculation of DDXs for 20, 34, 48, 62.9, 63, 78, 113, 256, 597, and 800 MeV, as well as 1.0, 1.2, 1.5, 1.6, and 3.0 GeV p +  nat/208Pb reactions, where the values in each bin are normalized such that the integral value is unity. In each panel, the datapoint with the error bar indicates qM and uncertainty width  −vx+ux of the distribution

Table 1. Summary of DDX experiments for  nat/208Pb(p,xn) reactions and evaluation results for each incident proton energy

Figure 3. Proton-induced natPb spallation neutron multiplicity (top panel: linear scale, bottom panel: logarithmic scale). The dot-dashed lines are the calculations with PHITS. The solid line is the JENDL-4.0/HE evaluation; the dotted line is the TENDL-2017 evaluation; the datapoints with error bars indicate xexpt

Figure 3. Proton-induced natPb spallation neutron multiplicity (top panel: linear scale, bottom panel: logarithmic scale). The dot-dashed lines are the calculations with PHITS. The solid line is the JENDL-4.0/HE evaluation; the dotted line is the TENDL-2017 evaluation; the datapoints with error bars indicate xexpt

Figure 4. Histogram of relative difference from the PHITS calculations for incident proton energies above 100 MeV. The dashed and solid curves indicate a fit to the histogram with Gaussian distribution and Student’s t-distribution, respectively (top panel: linear scale, bottom panel: logarithmic scale)

Figure 4. Histogram of relative difference from the PHITS calculations for incident proton energies above 100 MeV. The dashed and solid curves indicate a fit to the histogram with Gaussian distribution and Student’s t-distribution, respectively (top panel: linear scale, bottom panel: logarithmic scale)

Figure 5. Histogram of relative difference from EquationEquation.(12) for incident energies below 100 MeV (top panel: linear scale, bottom panel: logarithmic scale)

Figure 5. Histogram of relative difference from EquationEquation.(12)(12) xpn,fit(Ep)=a(Ep−c)b(n/p),(12) for incident energies below 100 MeV (top panel: linear scale, bottom panel: logarithmic scale)

Figure 6. Same as , but including the uncertainty estimated from xcalc, xfit, and xexpt (top panel: linear scale, bottom panel: logarithmic scale). The dotted lines and the dark and light bands are qM and 50% and 90% UIs, respectively

Figure 6. Same as Figure 3, but including the uncertainty estimated from xcalc, xfit, and xexpt (top panel: linear scale, bottom panel: logarithmic scale). The dotted lines and the dark and light bands are qM and 50% and 90% UIs, respectively

Table 2. Summary of statistical analyses for samples of drelx (Ep100 MeV) and δrelx (Ep<100 MeV)

Figure 7. Neutron-induced spallation proton multiplicity (xnn) (left panels), proton-induced spallation proton multiplicity (xpp) (middle panels), and neutron-induced spallation proton multiplicity (xnp) (right panels) inferred from the estimated xpn uncertainty and the PHITS nuclear reaction calculations (top panels: linear scale, bottom panels: logarithmic scale). The dark and light bands are 50% and 90% UIs, respectively

Figure 7. Neutron-induced spallation proton multiplicity (xnn) (left panels), proton-induced spallation proton multiplicity (xpp) (middle panels), and neutron-induced spallation proton multiplicity (xnp) (right panels) inferred from the estimated xpn uncertainty and the PHITS nuclear reaction calculations (top panels: linear scale, bottom panels: logarithmic scale). The dark and light bands are 50% and 90% UIs, respectively

Table 3. Summary of DDX experiments for  nat/208Pb(p,xp) reactions and evaluation results for each incident energy

Table 4. Estimates of xpn, xnn, xpp, and xnp for  natPb at representative incident energies

Figure 8. Responses of xrel random samples to σpn and σpp for the 800 MeV proton +  natPb reaction (top panel: histogram of the xrel random samples, right panel: histogram of the σpn and σpp output values, middle panel: relationship between xrel and σpn [σpp]). The datapoints with error bars are the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of the points with error bars. The sample size is 300

Figure 8. Responses of xrel random samples to σpn and σpp for the 800 MeV proton +  natPb reaction (top panel: histogram of the xrel random samples, right panel: histogram of the σpn and σpp output values, middle panel: relationship between xrel and σpn [σpp]). The datapoints with error bars are the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of the points with error bars. The sample size is 300

Figure 9. A schematic of the experimental condition [Citation55]

Figure 9. A schematic of the experimental condition [Citation55]

Table 5. Energy group structure for tally

Figure 10. Convergence of ψ (left panels) and their 1σ-equivalent uncertainties (right panels) as a function of the sample size (N) for the detector angle of 30 . For the left panels, the dots with error bars indicate the calculated ψ samples, the solid line is median of the ψ sample distributions, and the dashed line is a reference calculated without random sampling. For the right panels, the dashed line indicates δψstat, which is the 1σ statistical uncertainty of ψ averaged over N samples; the dot-dashed line is δψobs, which is the observed statistical uncertainty obtained from N PHITS runs; the solid line is δψx, which is the uncertainty due to x

Figure 10. Convergence of ψℓ (left panels) and their 1σ-equivalent uncertainties (right panels) as a function of the sample size (N) for the detector angle of 30 ∘. For the left panels, the dots with error bars indicate the calculated ψℓ samples, the solid line is median of the ψℓ sample distributions, and the dashed line is a reference calculated without random sampling. For the right panels, the dashed line indicates δψℓstat‾, which is the 1σ statistical uncertainty of ψℓ averaged over N samples; the dot-dashed line is δψℓobs, which is the observed statistical uncertainty obtained from N PHITS runs; the solid line is δψℓx, which is the uncertainty due to x

Figure 11. Estimated ψ along with experimental data, which is drawn using the logarithmic scale. The dark and light bands indicate 90% and 50% UIs, respectively, propagated from the estimated x uncertainty above 100 MeV

Figure 11. Estimated ψ along with experimental data, which is drawn using the logarithmic scale. The dark and light bands indicate 90% and 50% UIs, respectively, propagated from the estimated x uncertainty above 100 MeV

Figure 12. Same as , but drawn with the linear scale

Figure 12. Same as Figure 11, but drawn with the linear scale

Figure 13. Relationships between xrel random samples and ψ (=1,..,4) for the six detector angles in the sampling energy range from 100 to 500 MeV. For each panel, the datapoints with error bars indicate the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of points with the error bars; the dashed line with the dark and light bands indicates qM with observed 50% and 90% UIs of ψ, respectively. The sample size is 200

Figure 13. Relationships between xrel random samples and ψℓ (ℓ=1,..,4) for the six detector angles in the sampling energy range from 100 to 500 MeV. For each panel, the datapoints with error bars indicate the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of points with the error bars; the dashed line with the dark and light bands indicates qM with observed 50% and 90% UIs of ψ, respectively. The sample size is 200

Figure 14. Response of xrel random samples to ψ4 (top panel: histogram of the xrel random samples, right panel: histogram of the ψ4 output values, middle panel: relationship between xrel and ψ4). The datapoints with error bars are the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of points with error bars. The sample size is 800

Figure 14. Response of xrel random samples to ψ4 (top panel: histogram of the xrel random samples, right panel: histogram of the ψ4 output values, middle panel: relationship between xrel and ψ4). The datapoints with error bars are the calculation values with 1σ statistical uncertainties; the solid line is the least-squares linear fit for a set of points with error bars. The sample size is 800

Table 6. Energy group structure for random sampling

Figure 15. Energy breakdown of the response of xrel random samples to ψ(m) for the 30  detector angle

Figure 15. Energy breakdown of the response of xrel random samples to ψℓ(m) for the 30 ∘ detector angle

Figure 16. Relative sensitivity matrix of ψ(m) to xrel for each detector angle

Figure 16. Relative sensitivity matrix of ψℓ(m) to xrel for each detector angle

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