Robust estimation based on one-shot device test data under log-normal lifetimes

Abstract

In this paper, we present robust estimators for one-shot device test data under log-normal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study as well as two numerical examples.

Keywords:

• Divergences
• reliability
• robustness
• one-shot devices

Acknowledgments

We would like to thank the referees for their helpful comments and suggestions on an earlier version of this manuscript. Their comments have improved the paper.

Disclosure statement

No potential conflict of interest was reported by the author(s).