Figures & data
Figure 1. LSP process [Citation14].
![Figure 1. LSP process [Citation14].](/cms/asset/a35f682a-dab7-4136-9ed1-1d3eb7cf74d9/ysue_a_2060463_f0001_oc.jpg)
Figure 2. Schematic of (a) cross-section of the sample and photograph of (b) produced sample with a fabricated notch.
![Figure 2. Schematic of (a) cross-section of the sample and photograph of (b) produced sample with a fabricated notch.](/cms/asset/9d2ab943-a27d-4936-9721-a056cc9ed0f6/ysue_a_2060463_f0002_oc.jpg)
Table 1. Process parameters used for the manufacturing of AM samples.
Table 2. LSP parameters used for the processing.
Figure 5. Schematic of (a) 4-point bending test loading scheme and photograph of (b) 4-point bend test rig RUMUL.
![Figure 5. Schematic of (a) 4-point bending test loading scheme and photograph of (b) 4-point bend test rig RUMUL.](/cms/asset/e86c6df7-6680-4ede-b58a-5a06048ae568/ysue_a_2060463_f0005_oc.jpg)
Figure 8. (a,c,e) The SEM micrographs of unpeened, LSP treated with AIT, and LSP treated with VT, respectively. (b,d,f) EBSD micrographs of the same three samples.
![Figure 8. (a,c,e) The SEM micrographs of unpeened, LSP treated with AIT, and LSP treated with VT, respectively. (b,d,f) EBSD micrographs of the same three samples.](/cms/asset/acbea1d0-8818-4980-9989-2d4b4d60ce41/ysue_a_2060463_f0008_oc.jpg)