Figures & data
FIG. 3 Photograph of 100 nm PSL particles immersed in density reference liquids after settling for 30 days.
![FIG. 3 Photograph of 100 nm PSL particles immersed in density reference liquids after settling for 30 days.](/cms/asset/ca23ab26-34d7-40e6-a2d2-af5c221f0999/uast_a_171406_o_f0003g.gif)
TABLE 1 Summary of mass and diameter measurements of PSL particles
FIG. 4 Survival rate spectrum obtained (a) for NIST SRM 1963; (b) for JSR SC-011-S. The data indicated by the empty diamonds were not included in the least squares fitting; (c) for JSR SC-021-S under two different conditions: t h = 6 h and t h = 3 h. Note that the two data sets are plotted on different scales; (d) for NIST SRM 1691. The data indicated by the empty diamonds were not included in the least squares fitting; (e) for JSR SC-048-S; (f) for NIST SRM 1690; (g) for JSR SC-101-S.
![FIG. 4 Survival rate spectrum obtained (a) for NIST SRM 1963; (b) for JSR SC-011-S. The data indicated by the empty diamonds were not included in the least squares fitting; (c) for JSR SC-021-S under two different conditions: t h = 6 h and t h = 3 h. Note that the two data sets are plotted on different scales; (d) for NIST SRM 1691. The data indicated by the empty diamonds were not included in the least squares fitting; (e) for JSR SC-048-S; (f) for NIST SRM 1690; (g) for JSR SC-101-S.](/cms/asset/d0200978-ffcd-495a-ac7c-170491e4fb61/uast_a_171406_o_f0004g.gif)
TABLE 2 Summary of uncertainty analysis of D pa for NIST SRM 1963
TABLE 3 List of possible uncertainty sources not included in the uncertainty analysis
FIG. 6 Reproducibility of D pa obtained for JSR SC-021-S. The confidence interval for each of the data indicates the expanded uncertainty with a coverage factor of 2.
![FIG. 6 Reproducibility of D pa obtained for JSR SC-021-S. The confidence interval for each of the data indicates the expanded uncertainty with a coverage factor of 2.](/cms/asset/d7e58a2a-ffc4-49bd-8017-b9a5dac89043/uast_a_171406_o_f0006g.gif)
FIG. A1 Examples of temperature drift during the holding time on the back faces of the upper and lower electrodes. In the measurement of the No. 1 and No. 2 curves, thermistors A and B were used for the lower and upper electrodes, respectively, while in the measurements of the No. 3 and No. 4 curves, the two thermistors were exchanged.
![FIG. A1 Examples of temperature drift during the holding time on the back faces of the upper and lower electrodes. In the measurement of the No. 1 and No. 2 curves, thermistors A and B were used for the lower and upper electrodes, respectively, while in the measurements of the No. 3 and No. 4 curves, the two thermistors were exchanged.](/cms/asset/dfe0782b-282d-4129-a4f5-e1ff428a0235/uast_a_171406_o_f0007g.gif)