ABSTRACT
For a well-monitored process, occurrence of nondefect is a frequent event sampling inspection. A suitable model for this situation is a zero-inflated Poisson (ZIP) distribution. In this manuscript, we will focus on the designing of a more flexible sampling plan called the resubmitted lots plan. The parameters of the proposed sampling plan are determined through the nonlinear optimization solution. The advantage of the proposed plan over the existing sampling in terms of average sample number is discussed. An example is given for the illustration purpose.
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Acknowledgments
The authors are deeply thankful to editor and two reviewers for their valuable suggestions to improve the quality of this manuscript. The author Muhammad Aslam is indebted to Deanship of Scientific Research, King Abdulaziz University, Jeddah, Saudi Arabia, for providing excellent research facilities.