Abstract
This article develops a Phase I design structure of -Chart, namely Bayesian
-Chart, based on Bayesian (posterior distribution) framework assuming the normality of the quality characteristic to incorporate parameter uncertainty. Our approach consists of two stages: (i) construction of the control limits for
-Chart based on posterior distribution of unknown mean μ and (ii) evaluation of the performance of the proposed design structure. The proposed design structure of
-Chart is compared with the frequents design structure of
- Chart in terms of (i) width of the control region and (ii) power of detecting a shift in the location parameter of the process. It has been observed that the proposed design structure of
-Chart is performs better than the usual design structure to detecting shifts in the parameter of the process when the prior mean is close to the unknown target value.
Mathematics Subject Classification: