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Genetics and resistance/Génétique et résistance

DNA markers for resistance to common bunt in ‘McKenzie’ wheat

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Pages 328-337 | Received 19 Sep 2012, Accepted 06 Dec 2012, Published online: 04 Feb 2013

Figures & data

Table 1.  Mean common bunt per cent incidence, number of observations in the mean, standard deviation and standard error of the mean for parents, controls and lines of the ‘McKenzie’/BW711 population for field trials at Swift Current and Lethbridge in 2001, 2002 and 2008

Fig. 1. Frequency distribution of means for common bunt per cent incidence of the ‘McKenzie’/BW711 doubled haploid population (Bt10 lines removed) grown in the field near Swift Current, SK in 2008: Light grey columns with ‘McKenzie’ molecular variant for Xgwm573; dark grey columns with BW711 molecular variant for Xgwm573.

Fig. 1. Frequency distribution of means for common bunt per cent incidence of the ‘McKenzie’/BW711 doubled haploid population (Bt10 lines removed) grown in the field near Swift Current, SK in 2008: Light grey columns with ‘McKenzie’ molecular variant for Xgwm573; dark grey columns with BW711 molecular variant for Xgwm573.

Fig. 2. The QCbt.spa-7B.1 QTL for common bunt resistance identified in (A) ‘McKenzie’/BW711 population (Bt10 lines removed) using Simple Interval Mapping with MQTL with the least square means in 2008 (SC08LSM), 2001 (SC01) and 2002 (SC02) at Swift Current, and 2001 at Lethbridge (Leth01) and (B) validated in the ‘McKenzie’/ND744 population using Simple Interval Mapping with MQTL for Swift Current in 2007 (SC07) and 2008 (SC08). Values on each map provide cM distances between markers and significant markers are those with values (symbols) higher than the LOD threshold indicated in each chart by the straight line running from the top to the bottom of the chart.

Fig. 2. The QCbt.spa-7B.1 QTL for common bunt resistance identified in (A) ‘McKenzie’/BW711 population (Bt10 lines removed) using Simple Interval Mapping with MQTL with the least square means in 2008 (SC08LSM), 2001 (SC01) and 2002 (SC02) at Swift Current, and 2001 at Lethbridge (Leth01) and (B) validated in the ‘McKenzie’/ND744 population using Simple Interval Mapping with MQTL for Swift Current in 2007 (SC07) and 2008 (SC08). Values on each map provide cM distances between markers and significant markers are those with values (symbols) higher than the LOD threshold indicated in each chart by the straight line running from the top to the bottom of the chart.

Table 2.  Mean common bunt per cent incidence, number of observations in the mean, standard deviation and standard error of the mean for parents and controls and lines within the ‘McKenzie’/ND3085 population for field trials at Swift Current, 2006 and the ‘McKenzie’/ND744 population for field trials at Swift Current in 2007 and 2008

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