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Research Article

Variational Autoencoder for Classification and Regression for Out-of-Distribution Detection in Learning-Enabled Cyber-Physical Systems

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Article: 2131056 | Received 30 Jun 2022, Accepted 19 Sep 2022, Published online: 13 Oct 2022

Figures & data

Figure 1. Variational autoencoder for classification and regression model. Note that “Predictor” can be a classification or regression network.

Figure 1. Variational autoencoder for classification and regression model. Note that “Predictor” can be a classification or regression network.

Table 1. False alarms for detecting OOD data in N-BaIot dataset.

Table 2. Classification accuracy and AUROC for detecting OOD data in gearbox dataset.

Table 3. AUROC for detecting OOD data in MNIST dataset.

Table 4. VAE for classification architecture in MNIST.

Figure 2. Histogram of ground-truth distance in training dataset.

Figure 2. Histogram of ground-truth distance in training dataset.

Figure 3. The 2D embedded features visualized by t-SNE.

Figure 3. The 2D embedded features visualized by t-SNE.

Table 5. VAE for regression architecture in AEBS.

Figure 4. An episode with in-distribution data in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 4. An episode with in-distribution data in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 5. An episode with OOD data caused by covariate shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 5. An episode with OOD data caused by covariate shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Table 6. False alarms for detecting OOD data in AEBS.

Figure 6. Histogram of ground-truth distance of training dataset that excludes data ranging from 15 to 45.

Figure 6. Histogram of ground-truth distance of training dataset that excludes data ranging from 15 to 45.

Figure 7. An episode with OOD data caused by label shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 7. An episode with OOD data caused by label shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 8. An episode with OOD data caused by label concept shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 8. An episode with OOD data caused by label concept shift in AEBS (detector parameter: N=10, ω=4, τ=40).

Figure 9. Execution times of proposed method.

Figure 9. Execution times of proposed method.