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Abstract
Camouflage patterns consist of specified complex patterning where the reflectance, as a function of wavelength, of each pattern segment is specified. Camouflage complexity establishes a need to determine camouflage pattern reflectance characteristics as a function of observer distance. The apparent reflectance spectrum, the combination of all wavelengths of light reflected from large sample sizes for a given standoff distance, can serve as an evaluation tool for camouflage fabrics. Apparent reflectance spectrum is based on far-field and statistical characteristics of camouflage patterns due to diffuse scattering properties of electromagnetic waves. This report describes modeling and simulation of apparent reflectance spectra to be adopted as a foundation for multiple metrics used in evaluating camouflage patterns in terms of their far-field characteristics over the visible and shortwave infrared wavelengths. This approach allows for direct, numerical suitability comparisons between various fabrics that can be used to optimize camouflage selection for various operational environments.
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No potential conflict of interest was reported by the author(s).
Additional information
Notes on contributors
Edward Michaelchuck Jr.
Edward Michaelchuck Jr. is currently pursuing a Ph.D. in Electrical Engineering with a focus in Applied Electromagnetics at George Washington University. He received a M.S. degree in Electrical Engineering with a concentration in Applied Electromagnetics from George Washington University (2020) and a B.S. in Mechanical Engineering from Rowan University (2017). He is currently an engineer at the U.S. Naval Research Laboratory, Washington, D.C. with a tenure of 4 years. His expertise includes multispectral signature characterization and environmental testing of both fielded and prototype systems, and he also develops and incorporates innovative visible and thermal signature reduction capabilities into camouflage fabrics.
Scott Ramsey
Scott Ramsey received a M.S. degree in Forensic Chemistry from Michigan State University (2004), a B.S. degree in Biology from Florida State University (1995), and a B.S. degree in Chemistry (2000) from the University of North Florida. He is currently a Senior Research Scientist at the U.S. Naval Research Laboratory, Washington, D.C., where he has been for over 16 years, and has many publications, patents and awards. His expertise includes multispectral signature characterization and environmental testing of both fielded and prototype combat uniform systems, and also develops and incorporates into camouflage fabrics innovative visible and thermal signature reduction capabilities.
Troy Mayo
Troy Mayo is a Senior Laboratory Technician at the Signature Technology Office, U.S. Naval Research Laboratory, Washington, D.C. He is responsible for spectral-signature quality control evaluations for fielded warfighter gear, and for a wide range of spectral analysis programs, which include testing prototype combat uniform fabrics for thermal signature performance and durability.
Sarah Thompson
Sarah Thompson received a M.S. degree in Materials Science from the University of Wisconsin–Madison (2013), and B.S. degrees in Chemistry and Mathematics from Emory & Henry College (2011). She is currently a Research Chemist at the US Naval Research Laboratory, Washington D.C. with a tenure of 7 years. Her expertise is in instrumental methods of physical, electromagnetic, and optical characterization of materials, with engineering contributions in RF noise reduction solutions for naval systems and multispectral camouflage.
Samuel Lambrakos
Samuel G. Lambrakos received the Ph.D. degree in Physics from the Polytechnic Institute of New York University in 1983. He is currently a Research Physicist at the U.S. Naval Research Laboratory, Washington, DC, where he has been for over 35 years. His expertise is computational physics in general and has many publications, patents and awards. His recent studies concern computational materials physics and inverse spectral analysis.