Fragmentation testing for ductile thin films on polymer substrates

Abstract

Fragmentation testing of thin films on substrates has in the past been mostly performed in situ using optical and scanning electron microscopy. While these techniques work well for brittle materials, they cannot always discern the difference between through-thickness cracks (TTCs) and localized plastic deformation of ductile films. Here, we describe fragmentation testing with atomic force microscopy and present criterion to distinguish TTCs and localized deformation for ductile films.

Keywords:

• thin films
• atomic force microscopy
• crack growth
• deformation

Acknowledgements

Funding for this research has been provided by the Austrian Science Fund (FWF) under Project: P22648-N20. A. Hohenwarter is gratefully acknowledged for experimental help.