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Integrated Ferroelectrics
An International Journal
Volume 65, 2004 - Issue 1
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Original Articles

Dielectric Properties of Lanthanum-Doped Bismuth Layer-Structured Ferroelectrics

, , &
Pages 135-140 | Received 01 Apr 2004, Accepted 01 May 2004, Published online: 11 Aug 2010
 

Abstract

Dielectric permittivities of Bi4−x La x Ti3O12,SrBi4−x La x Ti4O15, (Bi,La)4Ti3O12-Sr(Bi,La)4Ti4O15, and Sr2Bi4−x La x Ti5O18 ceramics were investigated at different frequencies. The rare earth, La, content determined the ferroelectric characteristics of the compounds: for small La content, they behaved as typical ferroelectrics, but all of them tended to become relaxors as x increased. The existence of relaxor behavior was attributed to a ferroelectric microdomain state induced by random strain fields.

ACKNOWLEDGE

The authors acknowledge the financial support by the National Natural Science Foundation of China (Grant No. 10274066).

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