Advanced search
Publication Cover
Integrated Ferroelectrics
An International Journal
Volume 85, 2006 - Issue 1
Submit an article Journal homepage
163
Views
8
CrossRef citations to date
0
Altmetric
SECTION C: FeRAM MATERIALS: MATERIALS CHARACTERIZATION

SURFACE POTENTIAL RELAXATION OF FERROELECTRIC DOMAIN INVESTIGATED BY KELVIN PROBE FORCE MICROSCOPY

JIYOON KIM Electronic and Optical Materials Lab., Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1, Guseong-dong, Yuseong-gu, Daejeon, 305-701, Republic of Korea
,
YUNSEOK KIM Electronic and Optical Materials Lab., Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1, Guseong-dong, Yuseong-gu, Daejeon, 305-701, Republic of Korea
,
KWANGSOO NO Electronic and Optical Materials Lab., Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1, Guseong-dong, Yuseong-gu, Daejeon, 305-701, Republic of Korea
,
SIMON BÜHLMANN Nano Devices Lab., Samsung Advanced Institute of Technology, San 14-1, Nongseo-ri, Giheung-eup, Yongin-si, Gyeonggi-do, Republic of Korea
,
SEUNGBUM HONG Nano Devices Lab., Samsung Advanced Institute of Technology, San 14-1, Nongseo-ri, Giheung-eup, Yongin-si, Gyeonggi-do, Republic of Korea
,
YUN-WOO NAM Nano Devices Lab., Samsung Advanced Institute of Technology, San 14-1, Nongseo-ri, Giheung-eup, Yongin-si, Gyeonggi-do, Republic of Korea
&
SEUNG-HYUN KIM Inostek Inc., 356-1, Gyeonngi Technopark, 1271-11, Sa1-dong, Sangnok-gu, Ansan-si, Gyeonggi-do, 425-791, Republic of Korea
 show all
Pages 25-30 | Received 31 May 2006, Published online: 14 Feb 2007
 
Sample our Physical Sciences journals, sign in here to start your FREE access for 14 days

ABSTRACT

We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.

ACKNOWLEDGMENTS

The authors gratefully acknowledge the financial support of the Samsung Advanced Institute of Technology.

Log in via your institution

Access through your institution

Log in to Taylor & Francis Online

Restore content access

Restore content access for purchases made as guest
Purchase options * Save for later

PDF download + Online access

  • 48 hours access to article PDF & online version
  • Article PDF can be downloaded
  • Article PDF can be printed
USD 61.00 Add to cart

Issue Purchase

  • 30 days online access to complete issue
  • Article PDFs can be downloaded
  • Article PDFs can be printed
USD 2,157.00 Add to cart

* Local tax will be added as applicable

Related Research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.