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Abstract
Environment-friendly Ferroelectric Mn:BST//Mn:BZT multilayer with additional 2% Mn doping were epitaxially fabricated on (001) MgO substrates by pulsed laser deposition with same thickness but different stacking periodic numbers or each layer thickness. Microstructure studies by X-ray diffraction and transmission electron microscopy indicate that the multilayer is c-axis oriented with good epitaxial nature. The microwave (∼18GHz) dielectric property measurements show that the dielectric loss tangent rapidly decreases with the increase of each layer thickness. The loss tangent can be lowered down to ∼0.043 at ∼18GHz, which suggests that the Mn:BST//Mn:BZT multilayer system has great potential for the development of room temperature microwave elements and related applications.
Acknowledgments
Dr. Ming Liu and Dr. Chunrui Ma would like to acknowledge the support from the “China Scholarship Council” for the program of national study-abroad project for the postgraduates of high level universities at UTSA.